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Event

481. SMACD 2022

In the KI-EDA project, artificial neural networks are used to estimate model errors of behavioural models, which are essential for simulating integrated circuits. Photograph: IMMS.

International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design

Reference

482. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive

Alex S. Huaman, Stephan Gorges, Michael Katzschmann, Steffen Hesse, Thomas Fröhlich, Eberhard Manske, Geneva, Switzerland 2022 Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition

Event

483. EUSPEN 2022

Integration of one of the lifting and actuating units (LAUs) researched in the NanoFab project into the planar slider for nanometre-precise positioning. Photograph: IMMS.

euspen’s 22nd International Conference & Exhibition

Reference

484. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)

Ingo Ortlepp, Jaqueline Stauffenberg, Anja Krötschl, Denis Dontsov, Jens-Peter Zöllner, Steffen Hesse, Christoph Reuter, Steffen Strehle, Thomas Fröhlich, Ivo W. Rangelow, Eberhard Manske, 2022 Proc. SPIE 12054, Novel Patterning Technologies

Press release

485. High-precision drives released from vacuum

Dr Jens Flügge (left), PTB, and Steffen Hesse (right), IMMS, were honoured with a bronze medal in the competition of the iENA inventors’ fair for their new sealing for more precise displacement measurement in high-tech applications. Photograph: IMMS.

PTB and IMMS receive iENA bronze medal for new seal configuration for more precise displacement measurement in high-tech applications

Reference

486. iENA bronze medal for “Seal configuration for an interferometer route partially arranged in vacuum”

iENA 2021 Award – International Trade Fair for "Ideas - Inventions - New Products" in Nuremberg

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Event

487. Forum Künstliche Intelligenz

In the KIQ project, we investigated solutions for embedded AI and, on this basis, implemented an AI-based retrofittable and cost-effective solution for quality assurance of cutting tools. Photograph: IMMS.

Artificial Intelligence Forum of the German specialist media Elektronik, Elektronik automotive und Computer&AUTOMATION. The forum was cancelled by the organiser.

Reference

488. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen

Markus Ismer, Alexander Rolapp, Björn Bieske, Nürnberg, Germany 2022 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022

Media library

489. D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium

D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium www.imms.de/d4024a Performances of the imager Dye decay time > 1 µs Time resolution 20 ns Frame rate 24 fps Pixel fill factor 59 % Photo diode dark current 200 e–/s Charge conversion gain 27 µV/e– Full-well capacity 53 ke– D4024A DTEST1 DTEST2 DTEST3 ATEST1 ATEST2 SYNC1 SYNC2 I2C TRTXL TRTXR TRTD VRES VDDH VDDA Row Driver Heater Lock-In Pixel Array (256x128) VSSD Column ADC High Speed…

Event

490. 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022

Energy-autonomous NFC measuring system for reading out LFA test strips. Photograph: IMMS.

Accompanying conference of the SENSOR + TEST 2022 trade fair on sensors and measurement systems