1662 results
Event
  1. SMACD 2024  
Palm-sized open box with circuit boards. International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)  
Event
  2. Career Dates  
Two people in front of three small exhibition walls and behind a table with exhibits and information material. Career fair at the Leibniz University Hannover  
Reference
  3. DI-Meta-X: Bridging the Gap with Meta Formats  
Georg Gläser, Melanie Wilhelm Robert Fischbach Detlef Bille Jan Mehner Peter Kreutziger Auftaktveranstaltung Chipdesign Germany, 6. - 7. Juni 2024, Hannover  
Reference
  4. Enhancing Chemiluminescence-Detection with Dark-Count Rate Optimization Strategies for SPADs in Conventional CMOS Technologies  
Benjamin Saft, Alexander Zimmer Maximilian Wiener Mirjam Skadell Eric Schäfer ISSW 2024, The International SPAD Sensor Workshop & the SPAD SENSOR SCHOOL, 2024, June 3 - 6, Trento, Italy  
Reference
  5. VE-ARiS: Alberich und die Tarnkappenfabrik. SKAW – Schaltungskopierbarkeitsanalysewerkzeug  
Adrian Pitterling, Florian Kögler Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München  
Reference
  6. What The Fuzz (WTF): A Framework for Fuzz Testing ASIC Designs  
Henning Siemen, Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München  
Reference
  7. VE-ARiS: Elektronischer Knowhow-Schutz für innovative Sensorsysteme. Abwehr von Reserve-Engineering auf IC-Ebene  
Projektkonsortium VE-ARiS (iC-Haus GmbH, Wachendorff Automation GmbH & Co. KG, IMMS GmbH), Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München  
Reference
  8. A Charge Pump System with Controlled Input Impedance for Optimized RFID Energy Harvesting  
Rohit Kesharwani, Andre Jäger Martin Grabmann David Schreiber Georg Gläser Hani Abdullah Eric Schäfer 2024 IEEE International Conference on RFID (RFID), Boston, MA, USA, 2024, June 4-6, DOI: wird noch ergänzt.  
Reference
  9. TEEMSC – Trainable Energy Efficient Machine Diagnosis using Singular Values and Canonical Crosscorrelation  
Rick Pandey, Sebastian Uziel Tino Hutschenreuther Silvia Krug IEEE International Workshop on Metrology for Industry 4.0 and IoT, DOI: wird noch ergänzt, 2024, May 29-31, Florence, Italy  
Reference
  10. Effect of spent mushroom compost mulch and irrigation treatment on growth, yield and fruit quality of sweet cherry in a summer-dry climate  
Martin Penzel, Claudia Kuhaupt Maria Bamberg Silvia Krug European Horticulture Congress EHC, Symposia „Fruit Production Systems for Sustainable and Resilient Development“, 2024, May 12-16, Bucharest, Romania  
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