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SMACD 2022

Date, Type of contribution, Location:
,Talk,Villasimius, Sardinia, Italy
Title:

I) Spotting the gap in the design flow for superconducting electronic devices

II) Learn from error! ML-based model error estimation for design verification without false-positives

III) Teaching the MOSFET: A Circuit Designer’s View

Authors:

I: Frank Feldhoff (1), Georg Glaeser (2) and Hannes Toepfer (1,2)

II: Henning Siemen (2), Martin Grabmann (2) and Georg Gläser (2)

III: Ralf Sommer (1,2) and Carsten Gatermann (1)

(1) Technische Universität Ilmenau, Germany

(2) IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Germany

Event:
International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design
Further information:

Learn from error! ML-based model error estimation for design verification without false-positives

Henning Siemen, Martin Grabmann and Georg Gläser

IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Germany

Behavioral models are important tools for electronic system-level design and verification due to their simplicity and fast computing time. However, this simplicity is a double-edged sword as it introduces model errors that are hard to keep track of. In this paper, we present an approach to estimate the model error of behavioral models by utilizing an artificial neural network. This can be integrated into system-level simulations and provides online, reliable information on the validity of the model. Knowing the model error allows to evaluate trade-offs by tolerating errors where possible and ensuring precision where needed. Considering computing time, the proposed approach is low cost and aides the designer to balance speed and precision in the behavioral modeling of complex circuits. To demonstrate the capabilities of this approach, we showcase the performance in a case study.

 


Spotting the gap in the design flow for superconducting electronic devices

Frank Feldhoff (1), Georg Glaeser (1,2) and Hannes Toepfer (1,2)

(1) Technische Universität Ilmenau, Germany, (2) IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Germany

Quantum technologies have matured in a way that real applications are considered to be viable. The new quality emerges from the use of explicit quantum phenomena in single objects as qubits for computation, or photons for sensing and communication. However, to make these features exploitable, suitable microelectronic components for controlling and read- out of the quantum states have to be available. For this, superconductive solid-state electronic circuits are considered to be promising candidates. First demonstrations for suitability are known. In order to provide scaling towards large-scale integrated structures, appropriate design methods and capabilities have to be developed. We provide an assessment of the current state of design automation for such superconducting digital electronic structures and survey existing approaches and tools.


Teaching the MOSFET: A Circuit Designer’s View

Ralf Sommer (1,2) and Carsten Gatermann (1)

(1) Technische Universität Ilmenau, Germany, (2) IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Germany

Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) are the most common components within integrated circuits. That is why they are commonly taught in the courses of study for electrical engineers. Despite hundreds of papers and books on MOSFETs the intuitive explanation of its behavior rises questions of the students especially for the explanation of saturation behavior. Why is the current limited by the charge carriers that are in the semiconductor substrate and form the inversion layer? There is an almost infinite reservoir available from the battery and the terminals, isn't there? Why do the sets of characteristic curves not continue to follow the parabola instead of remaining constant from the peak point (transition from linear to saturation region)? The paper shows both the consistent and causal derivation of the Level 1 MOSFET behavior from a few equations and the illustrative explanations for students to understand this behavior. Finally, an outlook is given on today’s MOSFET models and the difficulties in interpreting especially their AC parameters.

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Core topic

AI-based design and test automation

We are researching to use AI to make the development process of integrated sensor systems safer and more cost-effective. AI can help developers in the process to avoid errors and apply informal knowledge in an automated way.

Service for R&D

IC design methods

We develop new AI-based methods and tools for your system-on-chip and FPGA designs to master the increasing complexity of integrated systems and thus further increase performance.

Research field

Integrated sensor systems

Here we investigate miniaturised systems manufactured in semiconductor technology consisting of microelectronic components for sensors applications, as well as methods to design these highly complex systems efficiently and safely.


Contact

Contact

Dipl.-Hdl. Dipl.-Des. Beate Hövelmans

Head of Corporate Communications

beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13

Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.

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