Event, 28 Oktober 2025
Expert day for precision metrology
Lectures, live applications, expert meeting, guided tours
Event, 28 Oktober 2025
IEEE MetroAgriFor 2025
2025 IEEE International Workshop on Metrology for Agriculture and Forestry

Project
PANDIA
IMMS develops novel CMOS and SPAD sensor ICs for spectroradiometers for faster and more sensitive analysis of light

Project
MikroGraph
IMMS is developing evaluation electronics for new, highly sensitive graphene sensor technology for on-site detection of micropollutants in wastewater.

Talk and poster presentation,
CMOS-basierte Sensorsysteme für die In-vitro-Diagnostik

Journal article,
Nanometer-Positionierung mit 6D-Regelung

Talk and poster presentation,











