2138 results
Reference
  411. Learn from error! ML-based model error estimation for design verification without false-positives  
Henning Siemen, Martin Grabmann Georg Gläser 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816317, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Event
  412. CIVEMSA 2022  
The IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications  
Event
  413. SMACD 2022  
International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design  
Reference
  414. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive  
Alex S. Huaman, Stephan Gorges Michael Katzschmann Steffen Hesse Thomas Fröhlich Eberhard Manske Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition, 30 May – 3 June 2022, Geneva, Switzerland  
Event
  415. EUSPEN 2022  
euspen’s 22nd International Conference & Exhibition  
Reference
  416. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)  
Ingo Ortlepp, Jaqueline Stauffenberg Anja Krötschl Denis Dontsov Jens-Peter Zöllner Steffen Hesse Christoph Reuter, Steffen Strehle Thomas Fröhlich Ivo W. Rangelow Eberhard Manske In Novel Patterning Technologies 2022 (Vol. 12054, pp. 76-87). SPIE, DOI: https://doi.org/10.1117/12.2615118  
Press release
  417. High-precision drives released from vacuum  
PTB and IMMS receive iENA bronze medal for new seal configuration for more precise displacement measurement in high-tech applications  
Event
  419. Forum Künstliche Intelligenz  
Artificial Intelligence Forum of the German specialist media Elektronik, Elektronik automotive und Computer&AUTOMATION. The forum was cancelled by the organiser.  
Reference
  420. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen  
Markus Ismer, Alexander Rolapp Björn Bieske 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022, 10.-11. Mai 2022, Nürnberg, Germany  
Search results 411 until 420 of 2138