1786 results
Media library
  771. Service Range Industrial Electronic and Measurement Technology  
Dienstleistungen Industrielle Elektronik und Messtechnik Service Range Industrial Electronic and Measurement Technology RF on-wafer measurement Based on many years of experience in circuit design and measurement technology, IMMS designs and implements innovative methods for micro and nano technology. Our services include • Measurements at transistor level • Measurement of modules • Characterization of complex applications • Circuit design / PCB layout. en pm S vel o de SYS TEM in RF ne ss POWER ELECTRONICS on Reliability in application cti High-end semiconductor test…  
Reference
  772. IRIS  
A procedure for in-line inspection of encapsulated MEMS silicon components  
Press release
  773. IMMS honoured with Best Demo Night Award for contribution to e-mobility  
Wireless sensor networks for the ”tactile road“ developed in the „sMobiliTy“ project.  
Press release
  774. IMMS receives Best Paper Award for work on computer-aided verification methods  
Novel approach to accelerate the development of Industry 4.0 applications  
Reference
  775. A Flexible Sensor Platform for Traffic Applications  
Elena Chervakova, Sven Engelhardt Marco Goetze Michael Rink Axl Schreiber DASIP 2015, Conference on Design & Architectures for Signal & Image Processing, 23.09.2015 - 25.09.2015, Cracow, Poland, (Best-Demo-Night-Award)  
Reference
  777. Autarke Strommesszange schützt vor Produktionsausfällen  
Tino Hutschenreuther, Hendrik Härter in Elektronik Praxis, September 2015, Seite 38 - 39, online: http://www.elektronikpraxis.vogel.de/messen-und-testen/articles/504598/  
Reference
  778. Drahtlos-Sensorplattform zur Verkehrsdatenerfassung  
Marco Götze, Embedded Design, V/2015, 17.09.2015  
Reference
  779. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept. 2015, Barcelona, Spain, (Best-Paper-Award), DOI: http://dx.doi.org/10.1109/FDL.2015.7306358, Print ISBN - IEEE Xplore 978-1-4673-7735-5  
Reference
  780. Automatic Annotation of Properties to ESL SystemC Models and Accelerated Simulation  
Georg Gläser, Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept., Barcelona, Spain  
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