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Reference

101. MC_NPS

Nano positioning system developed at IMMS with a motion range of Ø100 mm x 10 mm, which is being further developed for industrial use in the MC_NPS project with an adapted signal processor-based motion controller from SIOS. Photograph: IMMS.

Combination of a high-precision drive from research with industrial control for nanometre-precise positioning in high-tech applications

Press release

102. Nanometre-precise positioning for high-tech applications

Representatives of SIOS and IMMS, partners in the MC_NPS project, at the kick-off meeting on 5 November 2025 in Ilmenau. Photograph: Rolf Peukert, IMMS.

SIOS and IMMS combine expertise from research and industry in the new MC_NPS project

Reference

103. Quantization Compensator Network: Server-Side Feature Reconstruction in Partitioned IoT Systems

Isaac Sánchez Leal, Oscar Artur Bernd Berg, Silvia Krug, Eiraj Saqib, Irida Shallari, Axel Jantsch, Mattias O’Nils, Tomas Nordström, 2025 IEEE Access

Reference

104. NPS6D200: Long-Range-6D-Nanopositionierung mit interferometrischem Feedback für das Closed-Loop-Regelungssystem

Steffen Hesse, bei SIOS Meßtechnik GmbH, Ilmenau, Germany 2025 Experten-Tag für Präzisionsmesstechnik

Reference

105. Suitability of Radio Communication Technologies for Smart Orchards Considering Seasonal Effects

Silvia Krug, Falk Eisenreich, Tino Hutschenreuther, Bologna, Italy 2025 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)

Reference

106. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE

Florian Jung, Silvia Krug, Tino Hutschenreuther, Bologna, Italy 2025 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)

Event

107. inova 2025

Two people in front of three small exhibition walls and behind a table with exhibits and information material.

The career forum at Technische Universität Ilmenau

Event

108. IEEE MetroAgriFor 2025

Forest clearing in the Thuringian Forest with a tree stump and a tree stake with environmental sensors in the foreground.

2025 IEEE International Workshop on Metrology for Agriculture and Forestry

Event

109. Expert day for precision metrology

Close-up of the quartz glass slider with a metal lifting module, magnetic bridges and laser interferometer.

Lectures, live applications, expert meeting, guided tours

Reference

110. Dr. Christof Steiner, DITABIS AG

IMMS can do much more than ‘just’ chip development – especially in the field of photonics and sensor technology. What we particularly liked: The IMMS team quickly and flexibly integrated itself into our network of DITABIS developers and external partners – with lots of ideas and a genuine team spirit.