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Reference

61. Suitability of Radio Communication Technologies for Smart Orchards Considering Seasonal Effects

Silvia Krug, Falk Eisenreich, Tino Hutschenreuther, Bologna, Italy 2025 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)

Reference

62. Wire we doing this? Open-Source Digital Circuit Processing in Python

Manuel Jirsak, Adrian Pitterling, Georg Gläser, Dresden, Germany 2026 edaWorkshop26

Event

63. edaWorkshop26

In Meta-X, IMMS is developing an open-source software package based on Python for reading and modifying digital circuits. Photograph: IMMS.

The central German event on EDA in the sense of electronics, design and applications

Event

64. IT-KoM 2026

Two people next to an exhibition wall and behind a table with electronics and information material.

Careers Fair for the Applied Computer Science Department at Erfurt University of Applied Sciences

Event

65. Girls’Day 2026

Mädchen sitzen am Computer im Rechnerlabor.

Welche Aufgaben hat eigentlich ein Forschungsinstitut und wie sieht der Arbeitstag einer Ingenieurin aus?

Reference

66. Einsatz sebstlernender Verfahren in der industriellen Instandhaltung

Tino Hutschenreuther, Meiningen, Germany 2026 Industrieforum „Smarte Fertigung“: Automatisierung und Robotik praxisnah erleben

Event

67. WID 2026

Aufbau zur Bestimmung des Abweichungswinkels von Spiegeln in einem 6-DOF-Nanopositioniertisch. Foto: IMMS.

International Scientific Symposium on the occasion of the World Interferometry Day 2026

Reference

68. Determination of yaw angle of mirror origin in a 6-DOF nanopositioning stage

Davi Anders Brasil, Michael Katzschmann, Steffen Hesse, Ludwig Herzog, Thomas Kissinger, Thomas Fröhlich, Ilmenau, Germany 2026 International Scientific Symposium on World Interferometry Day 2026

Reference

69. Andrea Kulik, FRIZ Biochem

We were particularly impressed by IMMS’s ability to take a holistic approach to the interface between biochemical applications and electronic signal processing. This enabled our biochemical and technical requirements to be precisely translated into microelectronic concepts and implemented in a space-efficient manner.

Reference

70. DE 10 2024 130 098

Schematischer Querschnitt eines CMOS-ISFET mit einer ARC-Schicht

Ion-sensitive field-effect transistors