2149 results
Reference
  131. A virtual metrology frame test setup using fiber interferometric sensors  
Davi Anders Brasil, Steffen Hesse Ludwig Herzog Thomas Fröhlich Thomas Kissinger 22nd International Metrology Congress (CIM 2025), March 11-14, 2025, Lyon, France  
Event
  132. KI-Tag für den Mittelstand  
Veranstaltung des Mittelstand BVMW e.V. Thüringen im Rahmen der Thüringen Ausstellung in Zusammenarbeit mit dem ITnet Thüringen e.V.  
Event
  133. CIM 2025  
Complex construction of glass, metal, electronic and pneumatic components on a granite block. 22nd International Metrology Congress  
Event
  134. embedded world 2025  
Close-up of a milling machine to which an approximately 2 x 2 cm small wireless circuit board with sensors and an illuminated LED is held, accompanied by a graphic of a neural network and spreading radio waves. embedded world Exhibition & Conference 2025 | Meeting place for the embedded community  
Service for R&D
  136. Integrated Circuits  
Service for R&D: Integrated Circuits. We offer the design and realisation of application-specific integrated circuits (ASICs) in CMOS, BiCMOS and SOI technologies. We achieve well-performing ASICs with our first runs (first-time right silicon).  
Event
  137. KI zum Frühstück in Ilmenau  
Veranstalter: Thüringer Zentrum für Existenzgründungen und Unternehmertum (ThEx Wirtschaft 4.0), Mittelstand-Digital Zentrum Ilmenau, Wirtschaftsförderung Ilmenau, ZeTT Zentrum Digitale Transformation Thüringen  
Event
  138. Jahresauftakt MD & DGQ  
Jahresanfangs-Veranstaltung des „Mittelstand-Digital-Zentrums Ilmenau“ mit der Deutschen Gesellschaft für Qualität (DGQ) zur Digitalisierung in der Qualitätssicherung  
Service for R&D
  139. Development of embedded systems  
Service for R&D: Development of embedded systems: We develop embedded systems for you as complete solutions consisting of sensors and actuators, signal processing and communications technology as well as open-loop and closed-loop controls.  
Reference
  140. DE 10 2024 100 703  
Method and sensor arrangement for monitoring the function of a machine component  
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