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Reference

151. TEEMSC – Trainable Energy Efficient Machine Diagnosis using Singular Values and Canonical Crosscorrelation

Rick Pandey, Sebastian Uziel Tino Hutschenreuther Silvia Krug IEEE International Workshop on Metrology for Industry 4.0 and IoT, Florence, Italy, May 29-31, 2024, DOI: https://doi.org/10.1109/MetroInd4.0IoT61288.2024.10584173

Reference

152. Investigations on tip-based large area nanofabrication and nanometrology using a planar nanopositioning machine (NFM-100)

Jaqueline Stauffenberg, Johannes Belkner Denis Dontsov Ludwig Herzog Steffen Hesse Ivo W Rangelow Ingo Ortlepp Thomas Kissinger Eberhard Manske 2024 Meas. Sci. Technol. 35 085011, DOI: https://doi.org/10.1088/1361-6501/ad4668

Reference

153. Effect of spent mushroom compost mulch and irrigation treatment on growth, yield and fruit quality of sweet cherry in a summer-dry climate

Martin Penzel, Claudia Kuhaupt Maria Bamberg Silvia Krug European Horticulture Congress EHC, Symposia „Fruit Production Systems for Sustainable and Resilient Development“, Bucharest, Romania, May 12-16, 2024

Career

154. Internships, jobs, BSc/MSc subjects

Internships, jobs, BSc/MSc subjects: During your studies, you can get involved in ongoing research projects. Go to the limits of what is technically feasible and enter new ground together with us. We offer many practice-oriented topics as internships, bachelor and master theses.

Reference

155. Integration of Chemiluminescence-based SPARCL Assay on Microfluidic Platform with SPAD-based CMOS Line Sensor IC for Rapid Cytokine Detection in CRS

Benjamin Saft, Biljana Gjurova Pia Scholz Alexander Zimmer Mirjam Skadell Eric Schäfer Susann Allelein POCT Meeting 2024, 17. - 18. April 2024, Leipzig

Reference

156. Enhancing Apple Cultivar Classification Using Multiview Images

Silvia Krug, Tino Hutschenreuther J. Imaging 2024, 10, 94. DOI: https://doi.org/10.3390/jimaging10040094

Reference

157. MIRO

Unripe cherry on the tree, clutched by a metal construction.

Future-proof regional fruit growing through systematic data collection (digital twin) and data exchange along the value chain

Reference

158. Analog EDA Using Knowledge-Based Methods

Ralf Sommer, Jürgen Scheible Benjamin Prautsch Lorenz Renner Till Moldenhauer Yannick Uhlmann edaWorkshop 2024 and the European Nanoelectronics Applications, Design & Technology Conference (ADTC), 9. - 10. April 2024, Dresden, Germany

Reference

159. Trust is good, monitoring is better: An FPGA/TEE-Based Monitoring-Approach to Malware Detection and Prevention

Friederike Bruns, Georg Gläser Florian Kögler Jonas Lienke Nithin Ravani Nanjundaswamy Gregor Nitsche Behnam Razi Perjikolaei Jörg Walter edaWorkshop 2024 and the European Nanoelectronics Applications, Design & Technology Conference (ADTC), 9. - 10. April 2024, Dresden, Germany

Reference

160. SPAD-Elektronik für Quantentechnologie

Michael Meister, InnoLOG: Mitteldeutschland – Europäischer Hotspot der Mikroelektronik und Quantentechnologie, 4. April 2024, Erfurt, Germany