1755 results
Career
  181. Vocational Training  
[Translate to English:] Vocational Training: Sophisticated education in scientific environment. Since 1997 we have taken on trainees.  
Reference
  182. LO and Calibration Signal Distribution in a Multi-Antenna Satellite Navigation Receiver  
Uwe Stehr, Syed N. Hasnain Björn Bieske Marius Brachvogel Michael Meurer Matthias A. Hein in Proceedings of the European Navigation Conference 2023, Noordwijk, Zuid-Holland, May 31 - June 2, 2023, Eng. Proc. 2023, 54, 23. DOI: https://doi.org/10.3390/ENC2023-15447  
Reference
  183. Tip-based nanofabrication below 40 nm combined with a nanopositioning machine with a movement range of Ø100 mm  
Jaqueline Stauffenberg, Michael Reibe Anja Krötschl Christoph Reuter Ingo Ortlepp Denis Dontsov Steffen Hesse Ivo W. Rangelow Steffen Strehle Eberhard Manske Micro and Nano Engineering, Volume 19, 2023, 100201, ISSN 2590-0072, DOI: https://doi.org/10.1016/j.mne.2023.100201  
Reference
  184. Waist Tightening of CNNs: A Case study on Tiny YOLOv3 for Distributed IoT Implementations  
Isaac Sánchez Leal, Eiraj Saqib Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils In Proceedings of Cyber-Physical Systems and Internet of Things Week 2023 (CPS-IoT Week '23), Association for Computing Machinery, San Antonio, TX, USA, May 9-12, 2023, pp. 241–246, DOI: https://doi.org/10.1145/3576914.3587518  
Reference
  185. Intelligentes Design: KI für EDA?  
Georg Gläser, edaWorkshop23, 8. - 9. Mai 2023, Hannover, Germany  
Reference
  186. Frostrisikoerkennung mittels Knospenüberwachung im Obstbau  
Silvia Krug, Experimentierfelder-Konferenz 2023, 27. - 28. April 2023, Berlin  
Reference
  187. Verfahren zum Erweitern und Verwenden eines Modells zum Simulieren einer elektronischen Schaltung  
Georg Gläser, Martin Grabmann DE 10 2021 126 108 A1  
Reference
  188. A compact pump-probe optically pumped magnetometer system  
Theo Scholtes, Jannis Grixa Jakob Hampel Andreas Chwala Frank Bauer Ronny Stolz 16th Photonics Workshop, 12th - 15th March 2023, Kopaonik, Serbien  
Reference
  190. Messumgebung für Lebensdauertests basierend auf dem Konzept der universellen Test-Chips (UTC)  
Björn Bieske, Ingo Gryl Pierre Wenke Martin Jäger Jörg Steinecke Xiao Liu 35. ITG/GI/GMM-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2023), 26. - 28. Februar 2023, Erfurt, Germany  
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