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Patent Eric Schäfer, M. Sc.

Head of Microelectronics / Branch Office Erfurt

Eric Schäfer and his team research Integrated sensor systems, especially CMOS-based biosensors, ULP sensor systems and AI-based design and test automation. The results are being incorporated into research on the lead applications Sensor systems for in-vitro diagnostics and RFID sensor technology. It will assist you with services for the development of Integrated circuits and with IC design methods.

Patent No.:Eric Schäfer, M. Sc.

Inventor:

Research field:Integrated sensor systems

Date of first publication:11 November 2014


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Contact

Contact

Dr.-Ing. Ludwig Herzog

Head of Mechatronics

ludwig.herzog(at)imms.de+49 (0) 3677 874 93 60

Dr. Ludwig Herzog will provide detail on our research on magnetic 6D direct drives with nm precision for the nm measurement and structuring of objects. He supports you with services for the development of mechatronic systems, for simulation, design and test of MEMS as well as for finite element modelling (FEM) and simulation.

Contact

Dipl.-Ing. Michael Meister

Head of Industrial Electronics and Measurement Technology

michael.meister(at)imms.de+49 (0) 3677 874 93 20

Michael Meister is your contact for testing services, the development of test methodologies, and long-term measurements. He answers your questions on Modular and mobile test systems that we develop in our research in Smart distributed measurement and test systems as well as about testing and characterisation of integrated sensor systems. He is responsible for the test equipment at IMMS and will support you in the validation of ASIC and MEMS developments.

Microelectronics department

Our microelectronics team is internationally positioned and consists of specialists for:

  • Analog IC Design
  • Digital IC Design
  • Mixed-Signal Verification
  • IC Layout
  • Design Methodology
  • EDA Support
  • Business Development

Most of our scientific staff have academic degrees in electrical engineering and information technology, microelectronics and engineering informatics, or in disciplines such as biomedical engineering or solid-state physics.

Every year, we launch about ten ASICs for research and industrial customers and supervise about 15 students at our two locations in Erfurt and Ilmenau.


We support you with research and development in the following areas

Core topic

AI-based design and test automation

We are researching to use AI to make the development process of integrated sensor systems safer and more cost-effective. AI can help developers in the process to avoid errors and apply informal knowledge in an automated way.

Core topic

CMOS-based biosensors

We are researching CMOS-integrated transducers and their interaction with biological receptors. They offer the potential for precise, digital and cost-effective point-of-care tests and allow properties to be recorded on a molecular scale.

Service for R&D

IC design methods

We develop new AI-based methods and tools for your system-on-chip and FPGA designs to master the increasing complexity of integrated systems and thus further increase performance.

Service for R&D

Integrated Circuits

We offer the design and realisation of application-specific integrated circuits (ASICs) in CMOS, BiCMOS and SOI technologies. We achieve well-performing ASICs with our first runs (first-time right silicon).

Research field

Integrated sensor systems

Here we investigate miniaturised systems manufactured in semiconductor technology consisting of microelectronic components for sensors applications, as well as methods to design these highly complex systems efficiently and safely.

Lead application

RFID sensor technology

We are researching energy-efficient solutions for RFID sensor technology in order to open up new applications and, for example, to make processes in industry more resource-efficient.

Lead application

Sensor systems for in-vitro diagnostics

Here we are developing sensor systems for in-vitro diagnostics that enable individual, decentralised health monitoring for all with electronic rapid tests.


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