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Competition Runner-up für den Beitrag: Automated Generation of System-Level AMS Operating Condition Checks: Your Model's Insurance Policy

Auszeichnung mit dem Competition Runner-up auf der 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD, 12th-15th June 2017, Giardini Naxos - Taormina, ITALY
Date:
Award:
Competition Runner-up für den Beitrag: Automated Generation of System-Level AMS Operating Condition Checks: Your Model's Insurance Policy
Authors:
Georg Gläser1. Martin Grabmann1. Gerrit Kropp1. Andreas Fürtig2.
Event:

14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, 12th-15th June 2017, Giardini Naxos - Taormina, Italy

 
1IMMS Institut für Mikroelekronik- und Mechatronik-Systeme gemeinnützige GmbH, Ehrenbergstraße 27, 98693 Ilmenau, Germany. 2Institute for Computer Science, Goethe Universität Frankfurt a. M., Germany.

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1IMMS Institut fürMikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH, Ilmenau, Germany
2Reutlingen University, Reutlingen, Germany

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Contact

Contact

Eric Schäfer, M. Sc.

Head of Microelectronics / Branch Office Erfurt

eric.schaefer(at)imms.de+49 (0) 361 663 25 35

Eric Schäfer and his team research Integrated sensor systems, especially CMOS-based biosensors, ULP sensor systems and AI-based design and test automation. The results are being incorporated into research on the lead applications Sensor systems for in-vitro diagnostics and RFID sensor technology. It will assist you with services for the development of Integrated circuits and with IC design methods.

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