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Reference
  481. KODIAK  
IMMS researches image sensors for chemiluminescence assays with Thuringian industry and institutes from Erfurt-Südost and Jena  
Reference
  482. Trade-off between Spectral Feature Extractors for Machine Health Prognostics on Microcontrollers  
Umut Onus, Sebastian Uziel, Tino Hutschenreuther, Silvia Krug, Chemnitz, Germany 2022 2022 IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA)  
Reference
  483. Spotting the gap in the design flow for superconducting electronic devices  
Frank Feldhoff, Georg Gläser, Hannes Toepfer, Villasimius, Sardinia, Italy 2022 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)  
Reference
  484. Teaching the MOSFET: A Circuit Designer’s View  
Carsten Gatermann, Ralf Sommer, Villasimius, Sardinia, Italy 2022 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)  
Reference
  485. Learn from error! ML-based model error estimation for design verification without false-positives  
Henning Siemen, Martin Grabmann, Georg Gläser, Villasimius, Sardinia, Italy 2022 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)  
Event
  486. CIVEMSA 2022  
The IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications  
Event
  487. SMACD 2022  
International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design  
Reference
  488. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive  
Alex S. Huaman, Stephan Gorges, Michael Katzschmann, Steffen Hesse, Thomas Fröhlich, Eberhard Manske, Geneva, Switzerland 2022 Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition  
Event
  489. EUSPEN 2022  
euspen’s 22nd International Conference & Exhibition  
Reference
  490. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)  
Ingo Ortlepp, Jaqueline Stauffenberg, Anja Krötschl, Denis Dontsov, Jens-Peter Zöllner, Steffen Hesse, Christoph Reuter, Steffen Strehle, Thomas Fröhlich, Ivo W. Rangelow, Eberhard Manske, 2022 Proc. SPIE 12054, Novel Patterning Technologies  
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