2149 results
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  271. 2022 Annual Report | Article KI-EDA AMS ASIC Scope (en/de)  
2022 Jahresbericht | Fachartikel KI-EDA AMS ASIC Scope (en/de): Testbench in Hardware: AMS ASIC Scope zur Validierung KI-basierter Simulationsmethoden im Chip-Entwurf  
Media library
  272. 2022 Annual Report | Article SensoMem (en/de)  
2022 Jahresbericht | Fachartikel SensoMem (en/de): Sensorik zur Online-Überwachung von Membranreaktoren für Dialyseprozesse und In-vitro-Proteinsynthese großer Probenvolumina  
Reference
  273. Mit smarten Sensorsystemen und KI zu nachhaltigerer Produktion  
Wolfram Kattanek, Digital-Gipfel 2023, 20. November 2023, Jena  
Reference
  274. A Modular Platform to Build Task Specific IoT Network Solutions for Agriculture and Forestry  
Silvia Krug, Marco Goetze Sören Schneider Tino Hutschenreuther 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), Pisa, Italy, November 06-08, 2023, pp. 820-825, DOI: https://doi.org/10.1109/MetroAgriFor58484.2023.10424104  
Reference
  275. Plot-specific drought stress simulation in vineyards using a microclimatic monitoring system in combination with a radiation and water balance model  
Rikard Graß, Hannah Boedeker Marco Hofmann Martin Schieck Silvia Krug Tino Hutschenreuther Hannes Mollenhauer 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), Pisa, Italy, November 06-08, 2023, pp. 343-347, DOI: https://doi.org/10.1109/MetroAgriFor58484.2023.10424113  
Event
  276. MetroAgriFor 2023  
2023 International IEEE Workshop on Metrology for Agriculture and Forestry  
Reference
  277. iENA silver medal for “Circuit configuration to provide the charging energy for a level change on a signal bus, method for the calibration and signal transmission system”  
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Event
  278. inova 2023  
Career Forum at Ilmenau TU  
Reference
  279. KODIAK: Components and modules for improved optical diagnostics  
Michael Scholles, Nicole Isserstedt-John Dirk Kuhlmeier Martin Jahn Martin Reuter Benjamin Saft, Eric Schäfer Mirjam Skadell, Alexander Zimmer Ana Leonor H. Lopes MikroSystemTechnik Kongress 2023, 23. - 25. Oktober 2023, Dresden  
Reference
  280. Automatisiertes Testen mikroelektronischer Schaltungen – Fuzzing findet Bugs in Hardware  
Henning Siemen, Jonas Lienke Georg Gläser Elektronik, 21.2023, 18. Oktober 2023, Seite 64 - 67, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2321D  
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