1757 Ergebnisse
Referenz
  301. Spotting the gap in the design flow for superconducting electronic devices  
Frank Feldhoff, Georg Gläser Hannes Toepfer 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816318, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Referenz
  302. Teaching the MOSFET: A Circuit Designer’s View  
Carsten Gatermann, Ralf Sommer 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816264, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Referenz
  303. Learn from error! ML-based model error estimation for design verification without false-positives  
Henning Siemen, Martin Grabmann Georg Gläser 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816317, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Referenz
  304. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive  
Alex S. Huaman, Stephan Gorges Michael Katzschmann Steffen Hesse Thomas Fröhlich Eberhard Manske Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition, 30 May – 3 June 2022, Geneva, Switzerland  
Referenz
  305. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)  
Ingo Ortlepp, Jaqueline Stauffenberg Anja Krötschl Denis Dontsov Jens-Peter Zöllner Steffen Hesse Christoph Reuter, Steffen Strehle Thomas Fröhlich Ivo W. Rangelow Eberhard Manske In Novel Patterning Technologies 2022 (Vol. 12054, pp. 76-87). SPIE, DOI: https://doi.org/10.1117/12.2615118  
Pressemitteilungen
  306. Hochpräzise Antriebe dürfen aus dem Vakuum  
PTB und IMMS erhalten iENA-Bronzemedaille für neue Dichtungsanordnung zur präziseren Wegmessung in Hightech-Anwendungen  
Referenz
  308. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen  
Markus Ismer, Alexander Rolapp Björn Bieske 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022, 10.-11. Mai 2022, Nürnberg, Germany  
Mediathek
  309. D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium  
D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium www.imms.de/d4024a Performances of the imager Dye decay time > 1 µs Time resolution 20 ns Frame rate 24 fps Pixel fill factor 59 % Photo diode dark current 200 e–/s Charge conversion gain 27 µV/e– Full-well capacity 53 ke– D4024A DTEST1 DTEST2 DTEST3 ATEST1 ATEST2 SYNC1 SYNC2 I2C TRTXL TRTXR TRTD VRES VDDH VDDA Row Driver Heater Lock-In Pixel Array (256x128) VSSD Column ADC High Speed…  
Mediathek
  310. Jahresbericht 2020, Überblick zu Fachartikeln  
Jahresbericht 2020, Überblick zu Fachartikeln  
Suchergebnis 301 bis 310 von 1757