IMMS - Search

Reference

1. A new XY linear stage for Nano technology - The stage can draw 3 diameter true circle

F. Spiller, O. Mollenhauer Tokyo/Japan, Advanced Photonics Technology Exhibition, November 2003

Reference

2. SMARTIEHS

The developed test system can rapidly inspect about 10,000 structures on such wafers. Photograph: IMMS.

The newly developed measurement system can simultaneously inspect MEMS structures on wafer level to significantly reduce test effort.

Reference

3. THERMULAB

Microchip with an operating temperature of up to 150°C, developed by IMMS as part of the Thermulab project. Photograph: IMMS.

The developed highly accurate sensor system, operating at 150°C, improves the efficiency of industrial plants and combustion engines.

Press release

4. Best paper nomination at the European Microwave Conference 2013

Partners from Ilmenau University of Technology and IMMS in the anechoic chamber of the TU. Photograph: IMMS.

… receiver’s equivalent carrier-to-interference-plus-noise ratio when impinged with different numbers of diametrically polarized interferers. They observed that strong polarization impurity of the designed circular…

Reference

5. 4TPixel

IMMS’ ASIC development for a novel pixel cell enables low-noise high-quality recordings for X-ray photographs.

Reference

6. GreenSense

Vibrometric analysis for the MEMS energy harvesting systems developed at IMMS.

For bio-analysis IMMS developed energy-efficient multi-parametric RFID microsensors and energy harvesting modules for operating autonomous sensors.

About us

7. Dr.-Ing. Frank Spiller

Head of Business Development and Central Projects

About us

8. Eric Schäfer, M. Sc.

Microelectronics team at IMMS in Erfurt in 2022. Photograph: IMMS.

Head of Microelectronics / Branch Office Erfurt

9. 07_DGQ-Treffen-IMMS-TETRA_FINAL.pdf

… und Hans-Joachim Kelm, kaufmännischer Geschäftsführer des IMMS, erläuterten die Besonderheiten, die sich dabei für High-Tech-KMU ergeben. »Hier sind nicht nur Prozesse zu beachten, die zur gewünschten…

Press release

10. Intelligent measuring clamp detects parasitic currents in industrial plant

In a project with its partner Indu-Sol, IMMS developed the intelligent measuring clamp 'EMCheck® ISMZ I'. Photograph: IMMS.

Presented by IMMS at the embedded world 2015, Hall 4, Booth 160 (OSADL joint booth).