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Reference

11. Optical detected magnetic resonance (ODMR) of ASi-Sii defects: case of acceptor indium

Kevin Lauer, Bernd Hähnlein Mario Bähr Kai Kühnlenz Philipp Kellner Dirk Schulze Stefan Krischok Alexander Rolapp Christian Möller Thomas Ortlepp 4th DRD3 week on Solid State Detectors R&D, 10. –14. November 2025, CERN, Zürich, Schweiz

Reference

12. Smartes Maschinenmonitoring – Anomalien mit Edge-KI detektieren

Sebastian Uziel, in elektroniknet.de, 11. November, S. 37 - 40, https://www.elektroniknet.de/automation/industrie-40-iot/anomalien-mit-edge-ki-detektieren.228572.html und in Markt&Technik, Trend Guide 2025, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/MUT?catalogName=MUTSH2507D

Press release

13. Ilmenau – Smart City aus eigener Kraft

A man on a ladder screws a sensor to a lamp post in front of a house.

Digitale Daten für mehr Komfort im Alltag der Bürgerinnen und Bürger: www.ilmenau.de/smartcity

Reference

14. MC_NPS

Nano positioning system developed at IMMS with a motion range of Ø100 mm x 10 mm, which is being further developed for industrial use in the MC_NPS project with an adapted signal processor-based motion controller from SIOS. Photograph: IMMS.

Combination of a high-precision drive from research with industrial control for nanometre-precise positioning in high-tech applications

Press release

15. Nanometre-precise positioning for high-tech applications

Representatives of SIOS and IMMS, partners in the MC_NPS project, at the kick-off meeting on 5 November 2025 in Ilmenau. Photograph: Rolf Peukert, IMMS.

SIOS and IMMS combine expertise from research and industry in the new MC_NPS project

Reference

16. Quantization Compensator Network: Server-Side Feature Reconstruction in Partitioned IoT Systems

Isaac Sánchez Leal, Oscar Artur Bernd Berg Silvia Krug Eiraj Saqib Irida Shallari Axel Jantsch Mattias O’Nils Tomas Nordström in IEEE Access, vol. 13, pp. 186488-186508, 2025, DOI: https://doi.org/10.1109/ACCESS.2025.3627072

Reference

17. NPS6D200: Long-Range-6D-Nanopositionierung mit interferometrischem Feedback für das Closed-Loop-Regelungssystem

Steffen Hesse, Experten-Tag für Präzisionsmesstechnik, 28. - 29. Oktober 2025, bei SIOS Meßtechnik GmbH, Ilmenau, Germany

Reference

18. Suitability of Radio Communication Technologies for Smart Orchards Considering Seasonal Effects

Silvia Krug, Falk Eisenreich Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy

Reference

19. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE

Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy

Reference

20. Dr. Christof Steiner, DITABIS AG

IMMS can do much more than ‘just’ chip development – especially in the field of photonics and sensor technology. What we particularly liked: The IMMS team quickly and flexibly integrated itself into our network of DITABIS developers and external partners – with lots of ideas and a genuine team spirit.