1722 results
Reference
  681. Investigations of metal systems in a silicon ceramic composite substrate for electrical and thermal contacts as well as associated mounting aspects  
M. Fischer, T. Welker B. Leistritz S. Gropp C. Schäffel M. Hoffmann J. Müller Ceramic Interconnect and Ceramic Microsystems Technologies, Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT): May 2016, Vol. 2016, No. CICMT, pp. 000107-000110, DOI: http://dx.doi.org/10.4071/2016CICMT-WA22  
Press release
  682. IMMS wins the HARTING MICA competition  
Entwicklungen zum Umweltmonitoring und zur Echtzeit-Datenverarbeitung haben überzeugt.  
Reference
  685. Adaptive Wireless Ad-hoc Sensor Networks for Long-term and Event-oriented Environmental Monitoring  
Jan Bumberger, Hannes Mollenhauer Paul Remmler Andrei Marian Chirila Olaf Mollenhauer Tino Hutschenreuther Hannes Toepfer Peter Dietrich European Geosciences Union General Assembly, EGU 2016, 17.04.2016-22.04.2016, Open Session on Geosciences Instrumentation and Methods, Vienna, Austria  
Reference
  686. Embedded tutorial: Analog-/mixed-signal verification methods for AMS coverage analysis  
Erich Barke, Georg Gläser Hyun-Sek Lukas Lee, Markus Olbrich Andreas Fürtig, Lars Hedrich Carna Radojicic, Christoph Grimm Fabian Speicher, Stefan Heinen Gregor Nitsche Eckhard Hennig Wolfgang Nebel 2016 Design, Automation & Test in Europe (DATE), 14-18 March 2016, pp. 1102 - 1111, http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7459473&isnumber=7459269  
Reference
  687. Hörbarmachung von Ultraschallsignalen  
Peter Holstein, Nicki Bader A. Tharandt R. John S. Uziel D. Januszko T. Hutschenreuther Fortschritte der Akustik - DAGA 2016, 42. Jahrestagung für Akustik, 14.-17. März 2016  
Reference
  688. Identification of Critical Scenarios in AMS Verification: Methodology for Finding the Safe Operating Area of AMS Systems  
Georg Gläser, Hyun-Sek Lukas Lee Markus Olbrich Erich Barke Eckhard Hennig 2016 Design, Automation & Test in Europe (DATE), 14 – 18 March 2016, University Booth, Embedded Tutorial: Analog-/Mixed-Signal Verification Methods for AMS Coverage Analysis, Dresden, Germany  
Reference
  689. Nanopositioning and nanomeasuring technology - following the challenges of nanofabrication  
E. Manske, T. Hausotte R. Füßl T. Fröhlich M. Hofmann I. Rangelow J. Reger C. Schäffel S. Sinzinger R. Theska 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods, Dimensional and related measurements in the micro- and nanometre range, March 9 - 11, 2016, Wroclaw, Poland  
Reference
  690. Hochtemperatur-Wafertest bis 300°C  
Marco Reinhard, Ulrich Liebold André Richter Ingo Gryl 28. GMM/GI/ITG Workshop – Testmethoden und Zuverlässigkeit von Schaltungen, TuZ 2016, 06.03.2016 - 08.03.2016, Siegen, Germany  
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