1721 results
Reference
  151. Timing Accurate Synthesis of Digital SystemC Components in a Mixed-Signal Environment  
Georg Gläser, Eckhard Hennig CDNLive2014, 19.05.2014 - 21.05.2014, München, Poster  
Press release
  152. Thuringian project develops novel technology platform for the detection of SARS-CoV-2  
Change in electrical conductivity visualises virus material  
Reference
  153. thurAI  
In thurAI, IMMS is working on sensor technology for SmartCity and methods to intelligently process data in the network for AI evaluations.  
Reference
  154. Thomas Freitag, Melexis  
”For many years, IMMS has been supporting us in the development and refinement of our ICs, among them those for LIN-based regulation of RGB LEDs. It is our intention to collaborate again with the Institute in the future, continuing to rely on its skills.“  
Reference
  155. Thick Copper Re-Distribution Layer for Integrated High Voltage Transistors  
Ralf Lerner, Klaus Heinrich Marco Erstling Peter Kornetzky 14th International Seminar on Power Semiconductors (ISPS), 29-31 August 2018, Prague, Czech Republic  
Reference
  156. THERMULAB  
The developed highly accurate sensor system, operating at 150°C, improves the efficiency of industrial plants and combustion engines.  
Reference
  157. Thermal Modeling and Measurement of a Power Amplifier Module for a Silicon-Ceramic Substrate  
Astrid Frank, V. Silva Cortes Steffen Michael A. Hagelauer G. Fischer 2018 11th German Microwave Conference (GeMiC), Freiburg, 12-14 March 2018, pp. 79-82. DOI: https://doi.org/10.23919/GEMIC.2018.8335033  
Reference
  158. Thermal Channel Noise of quarter and sub-quarter micron NMOS FET's  
G. Knoblinger, P. Klein U. Baumann ICMTS 2000, USA, CA, Monterey, März 2000  
Reference
  159. There is a limit to everything: Automated AMS Operating condition check Generation on System Level  
Georg Gläser, Martin Grabmann Gerrit Kropp Andreas Fürtig Integration, Volume 63, 2018, Pages 383-391, ISSN 0167-9260, DOI: https://doi.org/10.1016/j.vlsi.2018.02.016  
Reference
  160. Themenkreis Virtual Test und automatische Testplangenerierung aus ATML  
D. Glaser, P. Lu K. Helmreich I. Gryl M. Meister A. Lechner M. Jegler Z. Kiss Virtuelle Instrumente in der Praxis VIP 2010, 27.10.-28.10.2010, München, Proceedings  
Search results 151 until 160 of 1721