With the measurement technology presented, components can be individually stressed and their states can be documented during the entire test phase via continuous monitoring. Causes of failure can thus be analysed better and more specifically. Characterisation and marketing of semiconductor circuits and their technological manufacturing processes can be improved with the new environment.
The test environment was developed for HTOL (High-Temperature Operating Life Test) investigations on reliability and life time. It is modular and enables time- or cycle-based tests at up to 175 °C on up to 128 components simultaneously. These are not controlled in parallel with identical patterns, but an individual test sequence is generated for each individual component, during which digital and analogue parameters can be continuously observed.
Dipl.-Hdl. Dipl.-Des. Beate Hövelmans
Head of Corporate Communications
beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13
Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.