Modular measuring environment for mixed-signal real-time parameter acquisition during lifetime tests. Photograph: IMMS.

TuZ 2022

Date, Type of contribution, Location:

27 February 2022–01 March 2022,Talk

Title:

Messumgebung zur mixed-signal Echtzeit-Parametererfassung bei Lebensdauertests Measuring (environment for mixed-signal real-time parameter acquisition during durability tests)

Authors:

Michael Meister(IMMS), Björn Bieske (IMMS), Ingo Gryl (IMMS), Dagmar Kirsten (X-FAB Global Services GmbH)

Event:

34. ITG/GI/GMM-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (Workshop on test methods and reliability of circuits and systems)

Further information:

Conference page

Abstract:

With the measurement technology presented, components can be individually stressed and their states can be documented during the entire test phase via continuous monitoring. Causes of failure can thus be analysed better and more specifically. Characterisation and marketing of semiconductor circuits and their technological manufacturing processes can be improved with the new environment.

The test environment was developed for HTOL (High-Temperature Operating Life Test) investigations on reliability and life time. It is modular and enables time- or cycle-based tests at up to 175 °C on up to 128 components simultaneously. These are not controlled in parallel with identical patterns, but an individual test sequence is generated for each individual component, during which digital and analogue parameters can be continuously observed.

Modular measuring environment for mixed-signal real-time parameter acquisition during lifetime tests. Photograph: IMMS.

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Core topic

Modular and mobile test systems

Test capabilities are an integral part of all application developments. We research modular test systems that can be adapted flexibly and quickly to new challenges through optimised functional test units.

Service for R&D

Test and characterisation

We test, characterise and qualify your circuits, sensors and systems. Based on our excellent pool of measurement equipment, we develop an individually adapted test environment for measurements on wafers and individual components.

Contact

Dipl.-Hdl. Dipl.-Des. Beate Hövelmans

Head of Corporate Communications

beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13

Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.

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