Workshop Embedded Linux 4. und 5.11.2015, Ilmenau, Thüringen Anmeldung zum 30.10.20bis 15! Chancen, praktische Lösungsansätze und rechtliche Aspekte von Open Source Der Workshop behandelt ’Embedded Linux‘ und ’Open Source‘ für die Industrie sowohl von der theoretischen als auch von der praktischen Seite im Detail. Vor allem für Entwickler, aber auch für Einsteiger oder Projektleiter von Industrieunternehmen bietet der Workshop neue Einsichten und ganz praktische Anwendungsbeispiele für den Einsatz von Embedded Linux. Ziel ist es, Einblicke in die Leistungsfähigkeit von OpenSource-Lösungen…
Elena Chervakova, Marco Götze, Tino Hutschenreuther, Hannes Toepfer, Bojana Nikolić, Bojan Dimitrijević,
Niš, Serbia
2015
12th International Conference on Applied Electromagnetics, ELEKTROTECHNICA & ELEKTRONICA E+E
Bojan Dimitrijević, Bojana Nikolić, Slavoljub Aleksić, Nebojša Raičević, Hannes Toepfer, Elena Chervakova, Tino Hutschenreuther,
Niš, Serbia
2015
12th International Conference on Applied Electromagnetics, ELEKTROTECHNICA & ELEKTRONICA E+E
2008 Jahresbericht | Fachartikel SFB622 (de/en)
Planarmotorkonzept für die Positionierung mit Nanometerpräzision Planar Motor Concept for Positioning with Nanometer Precision Einleitung Introduction Das Erreichen von Unsicherheiten im Bereich weniger Nanometer in Verbindung mit einem Verfahrbereich von einigen 100 mm - das ist eine Zielstellung, die Forschergruppen weltweit beschäftigt. Positioning systems with uncertainties of just a few nanometers and travel ranges of 100 mm and higher - this is the ambition of many R&D institutes throughout the world. As a part of SFB 622, IMMS is…
2010 Jahresbericht | Fachartikel SFB622 (en/de)
15 3D POSITIONING SYSTEM IN THE RANGE OF NANOMETERS Collaborative Research Center 622 “NanoPositioning and NanoMeasuring Machines” IMMS had collaborated, in the part project A5, consiso, it is the aim of the operation of IMMS, to research Planar Air-guided Direct Drive System forces. The x-, y-position of the slider as well as the Minimization of Disturbances the basics of designing nanopositioning systems for A planar aerostatically guided direct drive system, rotation r z are measured by high-resolution plane Regarding absolute…
2010 Jahresbericht | Fachartikel SMARTIEHS (en/de)
15 Optimized Test of MEMS Hence, as an example, the whole conception of the nic control system on a substratum respectively on The fabrication processes of MEMS require a se- the components of the project partners. Another a chip. Mostly their size is only a few micrometers quence of test steps for the monitoring of quality subtask is the development of the regulation of the (example see figure 1). These tiny systems have un- and for the safeguarding of performance parame- scanning unit. But IMMS brings in already existing …
2012 Jahresbericht | Nominierung für den Innovationspreis Thüringen
TESTIM ONI ALS IMMS nominated for Thüringen’s 2012 Innovation Prize for magnetic levitation direct drive Having been nominated for the Thüringen Innovation Prize in 2012, IMMS was among the top three competitors in the “Industry and Materials” category. The direct drive is a positioning system completely controlled by magnetism and permitting a load to be swayed accurately through six coordinates. The IMMS made up of optical and capacitive detectors. Conventional sensors have to date worked on the laser interferometry…
A. Tag, Vikrant Chauhan, Robert Weigel, Amelie Hagelauer, B. Bader, C. Huck, M. Pitschi, Dominik Karolewski,
Taipei, Taiwan
2015
2015 IEEE International Ultrasonics Symposium (IUS)
Dienstleistungen Industrielle Elektronik und Messtechnik
Service Range Industrial Electronic and Measurement Technology RF on-wafer measurement Based on many years of experience in circuit design and measurement technology, IMMS designs and implements innovative methods for micro and nano technology. Our services include • Measurements at transistor level • Measurement of modules • Characterization of complex applications • Circuit design / PCB layout. en pm S vel o de SYS TEM in RF ne ss POWER ELECTRONICS on Reliability in application cti High-end semiconductor test…
