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Patent DE 10 2013 114 046

Electronic delay circuit in CMOS technology

Electronic delay circuit in CMOS technology for emitting an output signal (OUT/OUTB) delayed in time with respect to an input signal (IN), comprising

  • a CMOS thyristor primary switch formed from at least two transistors (M3, M6), whose switching signal (VT) occurring at the switching output is fed to a secondary switch which emits the output signal (OUT/OUTB);
  • an integration capacitor (C0) which is connected between a supply voltage (VDD) and a node (VCAP) which connects the gate electrode of one transistor (M6) to the drain electrode of the other transistor (M3) of the primary switch and which can be discharged via a discharging means (M2);
  • a switch (M4) which receives the input signal (IN) and is used to switch the discharging means (M2);
  • reset elements (M5, M7) for resetting the primary switch (M3, M6) after the output signal has changed; characterised in that an additionally connected component is arranged at the switching output (VT) of the primary switch (M3, M6) as a discharge element (C1; M9) for discharging the sub-threshold current of the primary switch (M3, M6).

Patent No.:DE 10 2013 114 046

Inventor:Benjamin Saft. Eric Schäfer. André Jäger

Application:

Delay elements as a component of integrated circuits in energy self-sufficient systems

Research field:Integrated sensor systems

granted patent

Application date:13 Dezember 2013

Date of first publication:18 Juni 2015

Date of publication of grant:24 Dezember 2015


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Contact

Contact

Eric Schäfer, M. Sc.

Head of Microelectronics / Branch Office Erfurt

eric.schaefer(at)imms.de+49 (0) 361 663 25 35

Eric Schäfer and his team research Integrated sensor systems, especially CMOS-based biosensors, ULP sensor systems and AI-based design and test automation. The results are being incorporated into research on the lead applications Sensor systems for in-vitro diagnostics and RFID sensor technology. It will assist you with services for the development of Integrated circuits and with IC design methods.

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Dr.-Ing. Tino Hutschenreuther

Head of System Design

tino.hutschenreuther(at)imms.de+49 (0) 3677 874 93 40

Dr. Tino Hutschenreuther will answer your questions on our research in Smart distributed measurement and test systems and the related core topics Analysis of distributed IoT systems, Embedded AI and Real-time data processing and communications, on the lead applications Adaptive edge AI systems for industrial application and IoT systems for cooperative environmental monitoring as well as on the range of services for the development of embedded systems.


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