AI Spring 2023
1) KI für optische Prüfprozesse in der Qualitätskontrolle (AI for optical inspection processes in quality control)
2) Industrielle Edge-KI-Systeme für die vorausschauende Wartung (Industrial edge AI systems for predictive maintenance)
3) KI für Verschleißprognosen an Zerspanwerkzeugen (AI for wear predictions on cutting tools)
1) Felix Franke, d-opt
2) Sebastian Uziel, IMMS
3) Wolfram Kattanek, IMMS/Mittelstand-Digital Zentrum Ilmenau
Abstract:
Quality assurance in manufacturing processes and condition monitoring of machines and systems are typical use cases for AI in production. Corresponding solutions are based on machine learning methods, for which a sufficient amount of representative and high-quality training data is required. Often, these must first be generated, for which both existing sensor technology and retrofittable systems can be used. In some applications, it is necessary for the AI models trained for classifications or predictions to be executed close to the sensor or process. Specialised device platforms can provide benefits for implementing such solutions. In this AI Spring event, these aspects will be explained with some application examples and potentials for more advanced deployment scenarios will be highlighted.
Event Objective:
The three presentations will provide an insight into both existing AI applications in manufacturing companies and novel application areas which can be opened up through the use of smart sensor systems.
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Lead application
Adaptive edge AI systems for industrial application
We are researching solutions for adaptive edge AI systems to make AI possible on low-consumption embedded systems in industry and to network them in real time.
Service for R&D
Development of embedded systems
We develop embedded systems for you as complete solutions consisting of sensors and actuators, signal processing and communications technology as well as open-loop and closed-loop controls.
Core topic
Embedded AI
The numerous existing AI algorithms and methods for high-performance computing are unsuitable for embedded systems. We are researching to optimise AI algorithms and methods so that they can be used on embedded systems.
Research field
Smart distributed measurement and test systems
Integrated sensor ICs are the heart of sensor and measurement systems like wireless sensors, stationary or handheld devices. We are researching solutions for ever more powerful sensors with more intrinsic intelligence and task allocation in the network.
Contact
Contact
Dipl.-Hdl. Dipl.-Des. Beate Hövelmans
Head of Corporate Communications
beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13
Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.