IMMS - Search

Event

901. ETD 2023

Preliminary work for a SPAD test stand with measuring chamber for fluorescent dye. Photograph: IMMS.

Erfurt Technology Dialogue

Reference

902. European roadmap on superconductive electronics - status and perspectives

Autorenkollektiv, Prof. Dr. H. Töpfer In: Physica, C: Superconductivity, Volume 470, Issues 23-24, Pages 2079-2126, 15.12.2010, Amsterdam, NL: Elsevier Science BV Fachartikel 2010

Event

903. EUSPEN 2021

Special Interest Group Meeting: Micro/Nano Manufacturing

Event

904. euspen 2022

3D lift and tilt test setup for the evaluation of vertical nanopositioners for 10 mm stroke. Photograph: IMMS.

Euspen Special Interest Group Meeting: Precision Motion Systems & Control 15th – 16th November 2022

Event

905. EUSPEN 2022

Integration of one of the lifting and actuating units (LAUs) researched in the NanoFab project into the planar slider for nanometre-precise positioning. Photograph: IMMS.

euspen’s 22nd International Conference & Exhibition

Event

906. euspen SIC 2025

Symbolic image with parts of a precision drive, a model of a magnetic coil whose data is fed into or generated from an AI visualised as a chip with brain structures.

euspen Special Interest Conference: Precision & Performance 2025 (combining MATADOR, LAMDAMAP & Thermal Issues)

Event

907. euspen SIG: Micro/Nano Manufacturing 2023

Laser focus sensor for unconventional, lateral measurements of nanopositioning stages. Photograph: IMMS.

euspen Special Interest Group Meeting: Micro/Nano Manufacturing 2023

Reference

908. Evaluation and testing of GNSS receivers with real and synthetic satellite signals

Björn Bieske, Uwe Stehr Matthias Hein Syed N. Hasnain 36. ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2024), 25. - 27. Februar 2024, Darmstadt, Germany

Reference

909. Evaluation of 2D-/3D-Feet-Detection Methods for Semi-Autonomous Powered Wheelchair Navigation

Cristian Vilar Giménez, Silvia Krug Faisal Z. Qureshi Mattias O’Nils Journal of Imaging, vol. 7, no. 12, p. 255, Nov. 2021, DOI: https://doi.org/10.3390/jimaging7120255

Reference

910. Evaluation of FinFET RF Building Blocks

G. Knoblinger, M. Fulde D. Siprak, U. Hodel, K. Von Arnim, Th. Schulz, C. Pacha U. Baumann A. Marshall, W. Xiong, C. R. Cleavelin P. Patruno K. Schruefer IEEE International SOI Conference, 1.-4. Oktober 2007, Indian Wells (USA)