ETD 2023
Test setup for measurements on single photon detectors with a temporal resolution of 20 picoseconds
Abstract:
We will be there on 24 April for the Technology Dialogue in Erfurt and, together with colleagues from Friedrich Schiller University in Jena, we will be showing a joint setup from the Quantum Hub Thüringen research project.
There, we are researching the use of single photon detectors (SPAD), which are manufactured in a standard semiconductor technology (CMOS). They are used to convert single photons into electrical signals and allow operation at room temperature without large and complex cooling systems. We will show a test setup developed for this purpose for a single photon source. Among other things, this will support the development of applications in quantum technology and quantum communications.
This setup also contains the principle of our SPAD evalkit, which we will also present. It is suitable for quantum-based applications that require very high light sensitivity or exact temporal measurements, such as in medical technology. Our setup enables measurements on single photon detectors with a temporal resolution of about 20 picoseconds.
Related content
Project
FluoResYst
The IMMS is developing a SPAD-based sensor for time-resolved readout of fluorescence-labelled DNA microarrays.
Project
Quantum Hub Thüringen
For quantum technology from Thüringen, Germany, IMMS is researching CMOS-based single-photon detectors.
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Award
Silicon Science Award for the work on “Time-correlated single-photon counting for time domain characterisation of high-speed light sources using programmable logic devices”
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Here we investigate miniaturised systems manufactured in semiconductor technology consisting of microelectronic components for sensors applications, as well as methods to design these highly complex systems efficiently and safely.
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Test capabilities are an integral part of all application developments. We research modular test systems that can be adapted flexibly and quickly to new challenges through optimised functional test units.
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Integrated sensor ICs are the heart of sensor and measurement systems like wireless sensors, stationary or handheld devices. We are researching solutions for ever more powerful sensors with more intrinsic intelligence and task allocation in the network.
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