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Reference

571. Pikosekundenschnelle Lichtmessungen für die Quantenforschung – Einzelphotonen präzise messen

Jakob Hampel, 2024 Elektronik, 04.2024

Reference

572. Piezoelectric AIN-biomorph benders as low-frequent, resonant microactuators with large travel range

Reference

573. Picometer-Scale Positioning of a Linear Drive System via Feedforward-Feedback Control

Alex S. Huaman, Michael Katzschmann, Steffen Hesse, Christoph Schäffel, Christoph Weise, Denis Dontsov, Eberhard Manske, Johann Reger, Kashiwa, Japan 2021 2021 IEEE International Conference on Mechatronics (ICM2021)

Reference

574. PIC-PAM

Integrated optical circuit with fibre-optic connections (top and bottom)

Photonic integrated circuits for quantum key distribution to protect against cyberattacks: Design of a time-tagging ASIC with a photonic integrated polarisation analysis unit

Reference

575. Physical Design and Verification of MEMS, RoMulus – Robuste Multisensorik zur Zustandsüberwachung in Industrie-4.0-Anwendungen

Volker Boos, Jenny Klaus, Gerold Schröpfer, Johannes Eisenmenger, Johannes Seelhorst, Dresden 2017 edaWorkshop 2017

Reference

576. Photo detector IC for Blu-ray-Disc applications: a realization applying efficient design methodologies

Reference

577. Peter Otto, Postberg

“We are very satisfied with the result – the many years of IMMS experience in the design of embedded systems, with industrial projects and also the system understanding of IMMS from the previous product developments with SONOTEC have clearly contributed to the success.”

Reference

578. Peter Chall, ALSI

”The achieved extreme precision, reproducibility and productivity of the laser dicing technology are at the forefront of international excellence. The close cooperation with IMMS leads to innovative developments, which is a basis that we can count on to expand our position as a leading technology provider.“

Event

579. PES 2015

Lecture at the ”12th International Conference on Applied Electromagnetics“

Reference

580. Performance of SpaceTime Processing for ISI- and CCI-Suppression in Industrial Scenarios