IMMS - Search

Reference

571. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems

A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden

Reference

572. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen

S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt

Reference

573. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements

St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands

Reference

574. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements

St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig

Reference

575. Parameter Identification of Membrane Structures - Chances and Limitations

S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France

Reference

576. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing

, Microstructure User Meeting 2026, Symposium on optical vibration measurement, March 19, 2026, Waldbronn, Germany

Reference

577. PANDIA

Latest generation spectroradiometer: JETI specbos 2501. In the PANDIA project, integrated sensors will be developed for such devices to analyse light significantly better and more efficiently for many applications. Photograph: JETI GmbH.

IMMS develops novel CMOS and SPAD sensor ICs for spectroradiometers for faster and more sensitive analysis of light

Reference

578. Ovutinin

Mit einem neuen Ovulationsschnelltest soll die fruchtbare Phase bis zu 6 Tage vor dem Eisprung bestimmt werden. Image by Serhii Kuch from Pixabay.

For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.

Reference

579. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE

Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy

About us

580. Organisation

Organigram of IMMS. Photograph: Kvalifik, Unsplash.

Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.