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Reference

451. Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques

Sebastian Giessmann, Steffen Michael, Eric Lawrence, Heinrich Steger, 2023 Commercial Micro Manufacturing International Magazine (CMM Magazine), 08-2023

Reference

452. Charakterisierung und Test von elektrostatischen Energieharvestern – Eine neue Schaltungstopologie für exaktere Messungen

Björn Bieske, Gerrit Kropp, Lübeck 2017 29. GI/GMM/ITG-Workshop, Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017)

Reference

453. Charakterisierung von HF-Zellen verschiedener Technologien unter Nutzung modularer PXI-Testsysteme

Reference

454. Charakterisierung, Optimierung und PEEC-Modellierung für einen Signalübertragungsabschnitt in Multi-Chip-Modulen

Event

455. Chipdesign Germany

With Ilmenau TU, we have developed an AI-based anomaly detection method to automatically detect non-proven and potentially faulty locations in layouts. Our relatetd plugin for the free design tool KiCad is available on GitHub. Source: IMMS.

Eine Veranstaltung der Designinitiative Mikroelektronik

Reference

456. Christian Paintz, Melexis

“Particularly in the evaluation of measurement data, IMMS has impressively demonstrated that a learning algorithm is on a par with manual evaluation – while saving a great deal of time. We are also continuing to pursue methods for circuit and layout analysis, as we see great research and application potential here as well.”

Event

457. CIM 2025

Complex construction of glass, metal, electronic and pneumatic components on a granite block.

22nd International Metrology Congress

Event

458. CiS Workshop 2023

ANSYS simulation of MEMS structures for a model library to design novel multisensor applications. Photograph: IMMS.

Workshop Simulation & Design 2023 at CiS Forschungsinstitut für Mikrosensorik

Event

459. CIVEMSA 2022

The IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications

Reference

460. Clock Gate Insertion with a Yosys-based Netlist Modification Tool

Manuel Jirsak, Adrian Pitterling, Jonas Lienke, Georg Gläser, Heidelberg, Germany 2024 FPGA Ignite Summer School