2169 results
Reference
331.
Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques
Press release
334.
Reliable and faster chip designs through invasive and parametric simulation methods
Reference
337.
LO and Calibration Signal Distribution in a Multi-Antenna Satellite Navigation Receiver
Reference
338.
Tip-based nanofabrication below 40 nm combined with a nanopositioning machine with a movement range of Ø100 mm