1778 results
Reference
  311. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)  
Ingo Ortlepp, Jaqueline Stauffenberg Anja Krötschl Denis Dontsov Jens-Peter Zöllner Steffen Hesse Christoph Reuter, Steffen Strehle Thomas Fröhlich Ivo W. Rangelow Eberhard Manske In Novel Patterning Technologies 2022 (Vol. 12054, pp. 76-87). SPIE, DOI: https://doi.org/10.1117/12.2615118  
Press release
  312. High-precision drives released from vacuum  
PTB and IMMS receive iENA bronze medal for new seal configuration for more precise displacement measurement in high-tech applications  
Reference
  314. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen  
Markus Ismer, Alexander Rolapp Björn Bieske 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022, 10.-11. Mai 2022, Nürnberg, Germany  
Media library
  315. D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium  
D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium www.imms.de/d4024a Performances of the imager Dye decay time > 1 µs Time resolution 20 ns Frame rate 24 fps Pixel fill factor 59 % Photo diode dark current 200 e–/s Charge conversion gain 27 µV/e– Full-well capacity 53 ke– D4024A DTEST1 DTEST2 DTEST3 ATEST1 ATEST2 SYNC1 SYNC2 I2C TRTXL TRTXR TRTD VRES VDDH VDDA Row Driver Heater Lock-In Pixel Array (256x128) VSSD Column ADC High Speed…  
Media library
  316. Jahresbericht 2020, Überblick zu Fachartikeln  
Jahresbericht 2020, Überblick zu Fachartikeln  
About us
  318. Networks  
[Translate to English:] Networks: Wherever possible, we draw in regionally available technologies into our research and thus contribute to the networking of companies, with the aim of exploiting the innovation potential of small and medium-sized enterprises.  
Reference
  319. VE-VIDES – AP2, Design, Architektur und Modellierung, Vertrauenswürdig?  
Georg Gläser, Digitale Fachkonferenz „Vertrauenswürdige Elektronik 2022“, 9. - 10. März 2022, online  
Reference
  320. VE-ARiS – „Alberich“ – Machine-Learning-basierte Vorhersage der Kopierbarkeit von ASICs  
Florian Kögler, Digitale Fachkonferenz „Vertrauenswürdige Elektronik 2022“, 9. - 10. März 2022, online  
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