1785 results
Reference
  311. KODIAK  
IMMS researches image sensors for chemiluminescence assays with Thuringian industry and institutes from Erfurt-Südost and Jena  
Reference
  312. Trade-off between Spectral Feature Extractors for Machine Health Prognostics on Microcontrollers  
Umut Onus, Sebastian Uziel Tino Hutschenreuther Silvia Krug 2022 IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA), 2022, pp. 1-6, DOI: https://doi.org/10.1109/CIVEMSA53371.2022.9853642, 15 - 17 June 2022, Chemnitz, Germany  
Reference
  313. Spotting the gap in the design flow for superconducting electronic devices  
Frank Feldhoff, Georg Gläser Hannes Toepfer 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816318, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Reference
  314. Teaching the MOSFET: A Circuit Designer’s View  
Carsten Gatermann, Ralf Sommer 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816264, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Reference
  315. Learn from error! ML-based model error estimation for design verification without false-positives  
Henning Siemen, Martin Grabmann Georg Gläser 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, pp. 1-4, DOI: https://doi.org/10.1109/SMACD55068.2022.9816317, 12 - 15 June 2022, Villasimius, Sardinia, Italy  
Reference
  316. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive  
Alex S. Huaman, Stephan Gorges Michael Katzschmann Steffen Hesse Thomas Fröhlich Eberhard Manske Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition, 30 May – 3 June 2022, Geneva, Switzerland  
Reference
  317. Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)  
Ingo Ortlepp, Jaqueline Stauffenberg Anja Krötschl Denis Dontsov Jens-Peter Zöllner Steffen Hesse Christoph Reuter, Steffen Strehle Thomas Fröhlich Ivo W. Rangelow Eberhard Manske In Novel Patterning Technologies 2022 (Vol. 12054, pp. 76-87). SPIE, DOI: https://doi.org/10.1117/12.2615118  
Press release
  318. High-precision drives released from vacuum  
PTB and IMMS receive iENA bronze medal for new seal configuration for more precise displacement measurement in high-tech applications  
Reference
  320. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen  
Markus Ismer, Alexander Rolapp Björn Bieske 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022, 10.-11. Mai 2022, Nürnberg, Germany  
Search results 311 until 320 of 1785