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Event
  311. ZAKI Workshop  
AI is changing production processes  
Reference
  312. A Retrofit Streetlamp Monitoring Solution Using LoRaWAN Communications  
Sören Schneider, Marco Götze, Silvia Krug, Tino Hutschenreuther, 2024 Eng  
Reference
  313. An Improved Architecture for a Fully Digital UHF RFID PIE-Stream Data Recovery Circuit  
Georg Gläser, Björn Bieske, Jonas Lienke, Martin Grabmann, Hani Abdullah, David Schreiber, André Jäger, Eric Schäfer, Freiburg, Germany 2024 EASS – Energieautonome Sensorsysteme 2024, 12. GMM-Tagung  
Event
  314. EASS 2024  
A small circuit board with an encapsulated chip that is inserted into a large circuit board at a 90-degree angle. 12th GMM Conference on Energy Autonomous Sensor Systems  
Reference
  315. SPAD-Based Sensor IC for chemiluminescence assays in microfluidic channels  
Alexander Zimmer, Benjamin Saft, Maximilian Wiener, Jakob Hampel, Mirjam Skadell, Eric Schäfer, Shanghai, China 2024 Conference of Science & Technology for Integrated Circuits (CSTIC)  
Event
  316. CSTIC 2024  
Printed circuit board with microelectronic chip in a housing with microfluidic channels. Conference of Science & Technology for Integrated Circuits (CSTIC) in conjunction with SEMICON China 2024  
Reference
  317. Systematische Evaluation des Energieverbrauches von Funksensorknoten während der Entwicklungsphase als Werkzeug für energieeffizientes System-Design  
Alexander Jurin, Silvia Krug, Sebastian Uziel, Fellbach, Germany 2024 12. GMM/DVS-Fachtagung, Elektronische Baugruppen und Leiterplatten (EBL 2024)  
Event
  318. EBL 2024  
12th GMM/ DVS symposium: Electronic assemblies and printed circuit boards - sustainability and energy efficiency with smart electronics  
Reference
  319. Evaluation and testing of GNSS receivers with real and synthetic satellite signals  
Björn Bieske, Uwe Stehr, Matthias A. Hein, Syed N. Hasnain, Darmstadt, Germany 2024 36. ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2024)  
Event
  320. TuZ 2024  
36th ITG / GMM / GI -Workshop Test Methods and Reliability of Circuits and Systems  
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