2142 results
Reference
  1981. Trends in der Sensortechnologie - Einsatz der Sensorik für die Qualitätssicherung  
Wolfgang Sinn, Treffen des Regionalkreises Erfurt der Deutschen Gesellschaft für Qualität (DGQ), Ilmenau, 06.07.2012  
Reference
  1982. Tri-Gate Al0.2Ga0.8N/AlN/GaN HEMTs on SiC/Si-substrates  
Wael Jatal, Uwe Baumann Heiko O. Jacobs Frank Schwierz Jörg Pezoldt Materials Science Forum, ISSN: 1662-9752, Vol. 858, pp 1174-1177, DOI: http://www.scientific.net/MSF.858.1174, ©2016 Trans Tech Publications, Switzerland  
Reference
  1983. Trib.US  
Real-time capable platform and algorithms for mobile multi-sensor inspection device for the maintenance of roller bearings  
Reference
  1984. Trust is good, monitoring is better: An FPGA/TEE-Based Monitoring-Approach to Malware Detection and Prevention  
Friederike Bruns, Georg Gläser Florian Kögler Jonas Lienke Nithin Ravani Nanjundaswamy Gregor Nitsche Behnam Razi Perjikolaei Jörg Walter edaWorkshop 2024 and the European Nanoelectronics Applications, Design & Technology Conference (ADTC), 9. - 10. April 2024, Dresden, Germany  
Reference
  1985. Trust is Good, Monitoring is Better: FPGA- & TEE-Based Monitoring for Malware-Detection  
Friederike Bruns, Georg Gläser Florian Kögler Jonas Lienke Nithin R. Nanjundaswamy Gregor Nitsche Behnam R. Perjikolaei Jörg Walter 13th IMA International Conference on Modelling in Industrial Maintenance and Reliability MIMAR2025, July 8-10, 2025, Université de Lorraine, France, DOI: https://doi.org/10.19124/ima.2025.01.25  
Reference
  1986. TSN – ein neuer Vernetzungsstandard für Industrie 4.0  
Thomas Elste, Ralf Sommer edaWorkshop 2018, 16.-17. Mai 2018, Hannover  
Reference
  1987. TSN test lab  
In the Time Sensitive Networking (TSN) laboratory, IMMS is exploring the technological limits to the creation of data-intensive industrial real-time applications.  
Event
  1988. TUCconnect 2025  
Two people next to an exhibition wall and behind a table with electronics and information material. The Career Fair at Chemnitz University of Technology  
Event
  1990. TuZ 2016  
Two presentations at the 28th GMM/GI/ITG Workshop on test methods and reliability of circuits  
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