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Reference
  1721. Christian Paintz, Melexis  
“Particularly in the evaluation of measurement data, IMMS has impressively demonstrated that a learning algorithm is on a par with manual evaluation – while saving a great deal of time. We are also continuing to pursue methods for circuit and layout analysis, as we see great research and application potential here as well.”  
Event
  1722. Chipdesign Germany  
Eine Veranstaltung der Designinitiative Mikroelektronik  
Reference
  1725. Charakterisierung und Test von elektrostatischen Energieharvestern – Eine neue Schaltungstopologie für exaktere Messungen  
Björn Bieske, Gerrit Kropp, Lübeck 2017 29. GI/GMM/ITG-Workshop, Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017)  
Reference
  1726. Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques  
Sebastian Giessmann, Steffen Michael, Eric Lawrence, Heinrich Steger, 2023 Commercial Micro Manufacturing International Magazine (CMM Magazine), 08-2023  
Event
  1727. CHANTS 2017  
12th Workshop on Challenged Networks, Co-located with ACM MobiCom 2017  
Reference
  1728. Challenges of Building AI-Based Virtual Temperature Sensors for Nanopositioning Systems (NPS)  
Amin Suaad, Silvia Krug, Tino Hutschenreuther, Amalfi, Italy 2026 2026 IEEE Symposium on Artificial Intelligence for Instrumentation and Measurement (AI4IM)  
Reference
  1729. Challenges in Analog/Mixed-Signal EDA  
 
Reference
  1730. Challenges and Applications of Mobile Wireless ad-hoc Sensor Networks for Environmental Monitoring  
Jan Bumberger, Hannes Mollenhauer, Paul Remmler, Olaf Mollenhauer, Tino Hutschenreuther, Hannes Toepfer, P. Dietrich, Leipzig 2014 Workshop am Helmholtz-Zentrum für Umweltforschung – UFZ, Kommissionssitzung der Kommission I, Bodenphysik und Bodenhydrologie  
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