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Event

1681. Vertrauenswürdige Elektronik 2022

Das IMMS entwickelt in ARiS neue Entwurfsverfahren für einen Kopierschutz von integrierten Schaltungen, um das Know-how von Partnern zu sichern. Foto: IMMS.

Digital Conference of the Federal Ministry of Education and Research (BMBF) on trustworthy electronics

Reference

1682. VE-ARiS – „Alberich“ – Machine-Learning-basierte Vorhersage der Kopierbarkeit von ASICs

Florian Kögler, online 2022 Digitale Fachkonferenz „Vertrauenswürdige Elektronik 2022“

Reference

1683. VE-VIDES – AP2, Design, Architektur und Modellierung, Vertrauenswürdig?

Georg Gläser, online 2022 Digitale Fachkonferenz „Vertrauenswürdige Elektronik 2022“

Event

1684. BarCamp @ DATE 2022

Online BarCamp at the DATE 2020 conference. Source: community.cadence.com.

BarCamp on electronic design automation (EDA), microelectronics and (embedded) systems design

About us

1685. Networks

Networks: Wherever possible, we draw in regionally available technologies into our research and thus contribute to the networking of companies, with the aim of exploiting the innovation potential of small and medium-sized enterprises.

Media library

1686. Jahresbericht 2020, Überblick zu Fachartikeln

Jahresbericht 2020, Überblick zu Fachartikeln

Event

1687. 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022

Energy-autonomous NFC measuring system for reading out LFA test strips. Photograph: IMMS.

Accompanying conference of the SENSOR + TEST 2022 trade fair on sensors and measurement systems

Media library

1688. D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium

D4024A: CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium CMOS image sensor with high dynamic-range for time-resolved fluorescence with Europium www.imms.de/d4024a Performances of the imager Dye decay time > 1 µs Time resolution 20 ns Frame rate 24 fps Pixel fill factor 59 % Photo diode dark current 200 e–/s Charge conversion gain 27 µV/e– Full-well capacity 53 ke– D4024A DTEST1 DTEST2 DTEST3 ATEST1 ATEST2 SYNC1 SYNC2 I2C TRTXL TRTXR TRTD VRES VDDH VDDA Row Driver Heater Lock-In Pixel Array (256x128) VSSD Column ADC High Speed…

Reference

1689. Energieautarkes NFC-Messsystem zum Auslesen von LFA-Teststreifen

Markus Ismer, Alexander Rolapp, Björn Bieske, Nürnberg, Germany 2022 21. ITG/GMA Fachtagung Sensoren und Messsysteme 2022

Event

1690. Forum Künstliche Intelligenz

In the KIQ project, we investigated solutions for embedded AI and, on this basis, implemented an AI-based retrofittable and cost-effective solution for quality assurance of cutting tools. Photograph: IMMS.

Artificial Intelligence Forum of the German specialist media Elektronik, Elektronik automotive und Computer&AUTOMATION. The forum was cancelled by the organiser.