IMMS - Search

Reference

1681. RFID-Chip zum batterielosen Betrieb kommerzieller Sensoren für medizinische und industrielle Anwendungen

Muralikrishna Sathyamurthy, RFID im Blick, Ausgabe 05/2021, Seite 46 - 57, ISSN: 1860 - 5907

Event

1682. DVCon Europe

The Design and Verification Conference & Exhibition Europe

Reference

1683. Zeitaufgelöste Fluoreszenz für genaue und mobile In-vitro-Diagnostik

Eric Schäfer, Benjamin Saft DeviceMed, Das Community-Magazin, Jahrgang 17, Ausgabe 6, November 2021, Seite 40 - 41, https://www.devicemed.de, ISSN 1860-9414 | 69029

Reference

1684. Nanometergenaue Hubmodule für die Präzisionsantriebstechnik

Stephan Gorges, Konstruktion (2021) Nr. 11-12, Sonderteil Antriebstechnik, Seite 36 - 40, https://www.ingenieur.de/fachmedien/konstruktion/antriebstechnik/hubmodule-fuer-die-praezisionsantriebstechnik/

Press release

1685. 2020 annual report online

Annual Report 2020 cover photo: Smart distributed sensor technology for monitoring microclimate and drought stress in orchards. Photo: IMMS.

Here you can find the contents in brief and the entire report which is linked to further information, related articles and videos.

Event

1686. EUSPEN 2021

Special Interest Group Meeting: Micro/Nano Manufacturing

1687. Annual Report 2020: Contents in brief

Themenvorschau Jahresbericht 2020

Reference

1688. Interferometrically controlled, scalable x-y planar positioning stage concept

Ilko Rahneberg, Enrico Langlotz Denis Dontsov Steffen Hesse Jaqueline Stauffenberg Eberhard Manske Special Interest Group Meeting: Micro/Nano Manufacturing, 17 – 18 November 2021, Virtual

Reference

1689. Dalibor Stojkovic, ams OSRAM

“We appreciate both the technical expertise of IMMS and the high level of their commitment to our joint projects. The proactive and agile way of working of the IMMS colleagues is an essential building block for our joint success.”

Reference

1690. Christian Paintz, Melexis

“Particularly in the evaluation of measurement data, IMMS has impressively demonstrated that a learning algorithm is on a par with manual evaluation – while saving a great deal of time. We are also continuing to pursue methods for circuit and layout analysis, as we see great research and application potential here as well.”