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Reference

1601. Text messages

Text messages on 25 years of IMMS: Here you will find texts sent to us by our partners for our 25th anniversary. There are also many references to concrete projects and joint product developments. Many thanks!

Press release

1602. The 2016 Annual Report is available

We connect the digital to the analog world. Photograph: IMMS.

Here you can find the contents in brief and the entire report which is linked to further information, related articles and videos.

Reference

1603. The angle dependent ΔE effect in TiN/AlN/Ni micro cantilevers

Bernd Hähnlein, Maria Kellner Maximilian Krey Alireza Nikpourian Jörg Pezoldt Steffen Michael Hannes Töpfer Stefan Krischok Katja Tonisch Sensors and Actuators A: Physical, Volume 345, 2022, 113784, ISSN 0924-4247, DOI: https://doi.org/10.1016/j.sna.2022.113784

Reference

1604. The asynchronous rapid single-flux quantum electronics - a promising alternative for the development of high-performance digital circuits

B. Dimov, Th. Ortlepp V. Mladenov S. Terzieva F. H.Uhlmann Advances in Radio Science, Kleinheubacher Berichte, 6, 1-9, 2008

Reference

1605. The Rapid Single-Flux Quantum Technology - a Promising Alternative for the Development of High-Performance Digital Electronics

B. Dimov, T. Ortlepp H. F. Uhlmann Kleinheubacher Tagung 2007, 24.-27. September 2007, Miltenberg

Reference

1606. The sound of ultrasound

Nicki Bader, Peter Holstein Hans-Joachim Münch Sebastian Uziel Tino Hutschenreuther Steffen Seitz 26th International Congress on Sound and Vibration (ICSV26), 7 - 11 July 2019, Montréal, Canada, ISBN: 9781510892699

Reference

1607. Themenkreis Virtual Test und automatische Testplangenerierung aus ATML

D. Glaser, P. Lu K. Helmreich I. Gryl M. Meister A. Lechner M. Jegler Z. Kiss Virtuelle Instrumente in der Praxis VIP 2010, 27.10.-28.10.2010, München, Proceedings

Reference

1608. There is a limit to everything: Automated AMS Operating condition check Generation on System Level

Georg Gläser, Martin Grabmann Gerrit Kropp Andreas Fürtig Integration, Volume 63, 2018, Pages 383-391, ISSN 0167-9260, DOI: https://doi.org/10.1016/j.vlsi.2018.02.016

Reference

1609. Thermal Channel Noise of quarter and sub-quarter micron NMOS FET's

G. Knoblinger, P. Klein U. Baumann ICMTS 2000, USA, CA, Monterey, März 2000

Reference

1610. Thermal Modeling and Measurement of a Power Amplifier Module for a Silicon-Ceramic Substrate

Astrid Frank, V. Silva Cortes Steffen Michael A. Hagelauer G. Fischer 2018 11th German Microwave Conference (GeMiC), Freiburg, 12-14 March 2018, pp. 79-82. DOI: https://doi.org/10.23919/GEMIC.2018.8335033