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About us

1591. Organisation

Organigram of IMMS. Photograph: Kvalifik, Unsplash.

Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.

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1592. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE

Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy, pp. 330-335, DOI: https://doi.org/10.1109/MetroAgriFor66923.2025.11512381

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1593. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE

Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy

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1594. Ovutinin

Mit einem neuen Ovulationsschnelltest soll die fruchtbare Phase bis zu 6 Tage vor dem Eisprung bestimmt werden. Image by Serhii Kuch from Pixabay.

For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.

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1595. PANDIA

Latest generation spectroradiometer: JETI specbos 2501. In the PANDIA project, integrated sensors will be developed for such devices to analyse light significantly better and more efficiently for many applications. Photograph: JETI GmbH.

IMMS develops novel CMOS and SPAD sensor ICs for spectroradiometers for faster and more sensitive analysis of light

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1596. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing

, Microstructure User Meeting 2026, Symposium zur optischen Schwingungsmessung, 19. März 2026, Waldbronn, Germany

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1597. Parameter Identification of Membrane Structures - Chances and Limitations

S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France

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1598. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements

St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig

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1599. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements

St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands

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1600. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen

S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt