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Reference

1591. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements

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1592. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen

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1593. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems

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1594. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem

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1595. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints

Georg Gläser, Benjamin Saft, Ralf Sommer, Frankfurt on the Main, Germany 2017 FAC 2017, Frontiers in Analog CAD

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1596. Partners

Many partners from R&D projects also use our services and some we involve as innovative, certified manufacturing partners to cover the value chain up to series production. Photo (reticle for semiconductor manufacturing): X-FAB.

Partners: We involve innovative, certified manufacturing partners to cover the value chain in R&D projects. You will also find an overview of our project partners from science and industry and information on how you can become a partner.

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1597. Passive 350 GHz Video Imaging Systems for Security Apllications

E. Heinz, T. May, D. Born, G. Zieger, S. Anders, V. Zakosarenko, H.-G. Meyer, Christoph Schäffel, 2015 Journal of Infrared, Millimeter and Terahertz Waves

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1598. Patents

Photograph: Matt Ridley, Unsplash / editing: IMMS.

Patents Here you will find disclosed patent applications and granted patents for which IMMS is the owner or co-owner.

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1599. Perforated plates of inertial sensors – modeling by effective material properties

Steffen Michael, Astrid Frank, G. Hölzer, G. Lorenz, 2014 Procedia Engineering, EUROSENSORS 2014, the 28th European Conference on Solid-State Transducers

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1600. Performance of SpaceTime Processing for ISI- and CCI-Suppression in Industrial Scenarios