IMMS - Search

Reference

1531. Temperaturfeldberechnungen in der Mikromechanik

K. Rettig, 16. CAD-FEM User Meeting, Bad Neuenahr-Ahrweiler, Oktober 1998

Reference

1532. Temporal Decoupling with Error-Bounded Predictive Quantum Control

Georg Gläser, Gregor Nitsche Eckhard Hennig Languages, Design Methods and Tools for Electronic System Design, Selected Contributions from FDL 2015, ISBN 978-3-319-31722-9, pages 125-150

Reference

1533. Temporal Decoupling with Error-Bounded Predictive Quantum Control

Georg Gläser, Gregor Nitsche Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept. 2015, Barcelona, Spain, (Best-Paper-Award), DOI: http://dx.doi.org/10.1109/FDL.2015.7306358, Print ISBN - IEEE Xplore 978-1-4673-7735-5

Reference

1534. Terminalsystem 2.0: Neue, flexible Möglichkeiten der Kombination von PXI-Testerressourcen bis 1 GHz

Björn Bieske, Ludwig Kircher Alexander Rolapp 33. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021), 22. Februar 2021, online

Reference

1535. TESCA

Installing the scanner drive into the complete system at IPHT (project partner) in Jena, Germany. Photograph: IMMS.

The drive system for a terahertz camera allows security checks whereby people can be effectively scanned for hidden objects as they simply pass by.

Service for R&D

1536. Test and characterisation

Service for R&D: Test and characterisation. We test, characterise and qualify your circuits, sensors and systems. Based on our excellent pool of measurement equipment, we develop an individually adapted test environment for measurements on wafers and individual components.

Reference

1537. Test der Entwurfsmethode für inkrementelle Messsysteme anhand einer Beispielapplikation

J. Zellmann, IMMS F&E Report, 19.10.1999, Ilmenau

Reference

1538. Test differentieller Parameter von HF-Komponenten im GHz-Bereich

B. Bieske, 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 35, 15. - 17. Februar 2009, Bremen

Reference

1539. Test mit Zukunft - Smart PXI

M. Konrad, K. Förster Ilmenau: wiss. Kolloquium zum 15-jährigen Bestehen des IMMS. 05.05.2011

Reference

1540. Test of differential 2.4 GHz IEEE 802.15.4 / ZigBee ICs: Limits and Challenges

B. Bieske, M. Lange S. Beyer Semiconductor Conference Dresden 2008, 23.-24. April 2008, Dresden, Germany