IMMS - Search

Reference

1531. New methods for RF-characterisation of PDIC-photo diodes for DVD applications

M. Meister, B. Bieske ISCE 2006 - The Tenth IEEE International Symposium on Consumer Electronics, 29.06.-01.07.2006, St. Petersburg (Russland), ISBN: 1-4244-0216-6

Reference

1532. New Trends in the Specification of Automotive Embedded Systems

W. Kattanek, In: 43. Internationales Wissenschaftliches Kolloqium, Band 2, S. 82-87, Technische Universität Ilmenau, 1998

Reference

1533. New Trends in the Specification of Automotive Embedded Systems

W. Kattanek, 43.Internationales Wissenschaftliches Kolloqium, Band 2, S. 82-87. Technische Universität Ilmenau, 1998

Reference

1534. New Trends in the Specification of Automotive Embedded Systems

W.Kattanek, 43. Internationales Wissenschaftliches Kolloquium, September 1998, Ilmenau

Reference

1535. Next Generation Diagnostics: Highly Sensitive Integrated CMOS Photodiode Sensor Array for Light Absorption Measurement

Alexander Hofmann, Michael Meister Sensorica 2017, IEEE Workshop, http://d-nb.info/1137195215, 8-9 June 2017, Mülheim an der Ruhr

Reference

1536. Next generation test equipment for micro-production

K. Gastinger, M. Kujawinska U. Zeitner C. Gorecki Dr. Ch. Schäffel S. Beer R. Moosburger M. Pizzi Photonics Europe 2010, 12.04-16.04.2010, Brüssel, Belgien

Reference

1537. NFC Compatible Passive HF RFID Transponder for Wireless Bio-Sensing Applications

Muralikrishna Sathyamurthy, Sylvo Jäger 19. Heiligenstädter Kolloquium, 24.-26. September 2018

Reference

1538. NFC/HF-RFID transponder IC for Sensor Applications

Muralikrishna Sathyamurthy, Think Wireless IoT Day on Healthcare and Security, 12 May 2021, online

Reference

1539. NFM-100

High-precision drive systems with spatial (6D) positioning accuracies in the single-digit nm range.

For fundamental research on nanometrology and nanofabrication at Ilmenau TU, the nanofabrication machine NFM-100 was realised as a system which enables the scanning of surfaces (AFM) as well as the processing by field emission scanning probe lithography for the first time in an xy-travel range of Ø100 mm.

Reference

1540. NISP: An NFC to I2C Sensing Platform with Supply Interference Reduction for Flexible RFID Sensor Applications

, Jun Tan Muralikrishna Sathyamurthy Alexander Rolapp Jonathan Gamez Moataz Elkharashi Benjamin Saft Sylvo Jäger Ralf Sommer in IEEE Journal of Radio Frequency Identification, vol. 4, no. 1, pp. 3-13, March 2020, DOI: https://doi.org/10.1109/JRFID.2020.2967862