1311. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems   A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  

  1312. Application of a Modular Test System for Mixed Signal Tests   I. Gryl, V. Schulze Chip, Packaging, Design, Simulation and Test ? International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  

  1313. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements   St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  

  1314. One-step autozeroing two-stage amplifier with floating-gate memory cells   D. Kirsten, V. Schulze D. Nuernbergk DATE 2009, 20.-24. April 2009, Nizza, France  

  1315. A Novel Low-Voltage Bandgap Reference Topology   M. Isikhan, 21. Mikroelektronik-Seminar, 16.04.2009, Erfurt  

  1316. Quantitative analysis of system initialization in embedded Linux systems   A. Puschmann, Embedded Linux Conference 2009, 6. April 2009, San Francisco, CA, USA  

  1317. Entwurf von SC-Schaltungen - Grundlagen und grundlegende Probleme   B. Dimov, 20. Mikroelektronik-Seminar, 02.04.2009, Erfurt  

  1318. PXI - basierte Testplattformen für die Halbleiterindustrie   K. Förster, 9. ATE - Technologietag, 1. April 2009, Radolfzell  

  1319. In-Network Detection of Anomaly Regions in Sensor Networks with Obstacles   C. Franke, M. Karnstedt D. Klan M. Gertz K.-U. Sattler E. Chervakova Computer Science - Research and Development, Special issue 'BTW 2009 Best Papers”, Volume 24, Number 3, ISSN 1865-2034, Springer, 2009  

  1320. EEPROM-Speicherzelle und ihr Auswahltransistor   St. Richter, D. Nuernbergk S. Richter D. Kirsten Patentnr. 10 2004 011 858