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Reference

101. VE-ARiS: Elektronischer Knowhow-Schutz für innovative Sensorsysteme. Abwehr von Reserve-Engineering auf IC-Ebene

Projektkonsortium VE-ARiS (iC-Haus GmbH, Wachendorff Automation GmbH & Co. KG, IMMS GmbH), Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München

Reference

102. VE-ARiS: Alberich und die Tarnkappenfabrik. SKAW – Schaltungskopierbarkeitsanalysewerkzeug

Adrian Pitterling, Florian Kögler Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München

Reference

103. VE-ARiS – „Alberich“ – Machine-Learning-basierte Vorhersage der Kopierbarkeit von ASICs

Florian Kögler, Digitale Fachkonferenz „Vertrauenswürdige Elektronik 2022“, 9. - 10. März 2022, online

Reference

104. VE-ARiS

3 stacked circuit boards with components

IMMS developed copy protection solutions for integrated circuits to secure the know-how of partners

Event

105. VDMA LabTour Industrie 4.0 am IMMS

Event

106. VDI Vortragsveranstaltung im IMMS

Reference

107. Validierung KI-basierter Simulationsmethoden im Chip-Entwurf, Testbench in Hardware

Tom Reinhold, Elektronik, 25.2023, 29. November 2023, Seite 60 - 64, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2325D

Career

108. Vacancies and application process

IMMS team in Ilmenau 2024. A total of around 90 people work at IMMS in Ilmenau and Erfurt. Photograph: IMMS.

Vacancies and application process: Here you’ll find everything you need to know about announced positions, speculative applications, possible part-time employment during your studies and the application process with us. And some of our team members share their views.

Reference

109. UVM-based Verification of Smart-Sensor Systems

Muralikrishna Sathyamurthy, Felix Neumann Lukasz Kotynia Eckhard Hennig Ralf Sommer International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012, Digital Object Identifier: 10.1109/SMACD.2012.6339407, ISBN 978-1-4673-0685-0

Reference

110. UVM-based Verification of Smart-Sensor Systems

Muralikrishna Sathyamurthy, Felix Neumann Lukasz Kotynia Eckhard Hennig Ralf Sommer International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012, Seville, Spain, 19.09.2012-21.09.2012