Current Publication
Novel Metrics for Analog Mixed-Signal Coverage
Andreas Fürtig1.
Georg Gläser2.
Christoph Grimm3.
Lars Hedrich1.
Stefan Heinen6.
Hyun-Sek Lukas Lee4.
Gregor Nitsche5.
Markus Olbrich4.
Carna Radojicic3.
Fabian Speicher6.
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Dresden, Germany, 19-21 April 2017, pp. 97-102, DOI: doi.org/10.1109/DDECS.2017.7934589
1Institute for Computer Science, Goethe Universität Frankfurt a. M., Germany.
2IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH, 98693 Ilmenau, Germany.
3Design of Cyber-Physical Systems, Kaiserslautern University of Technology, Germany.
4Institute of Microelectronic Systems, Leibniz Universität Hannover, Germany.
5OFFIS, Institute for Information Technology, Germany.
6Chair of Integrated Analog Circuits, RWTH Aachen University, Germany.