Aktuelle Publikation
Novel Metrics for Analog Mixed-Signal Coverage
Andreas Fürtig1, Georg Gläser2, Christoph Grimm3, Lars Hedrich1, Stefan Heinen4, Hyun-Sek Lukas Lee5, Gregor Nitsche6, Markus Olbrich5, Carna Radojicic3, Fabian Speicher4
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), , Dresden, Germany, pp. 97-102, DOI: doi.org/10.1109/DDECS.2017.7934589
1Goethe Universität Frankfurt a. M., Institute for Computer Science, Robert-Mayer-Str. 11-15, 60325 Frankfurt am Main, Germany, 2IMMS Institut für Mikroelekronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH), Ehrenbergstraße 27, 98693 Ilmenau, Germany, 3Kaiserslautern University of Technology, Design of Cyber-Physical Systems, Paul-Ehrlich-Straße, 67663 Kaiserslautern, Germany, 4RWTH Aachen University, Chair of Integrated Analog Circuits, Templergraben 55, 52062 Aachen, Germany, 5Leibniz Universität Hannover, Institute of Microelectronic Systems, Appelstraße 4, 30167 Hannover, Germany, 6OFFIS e.V. Institut für Informatik, Escherweg 2, 26121 Oldenburg, Germany




