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AHMT Symposium 2026

Date, Type of contribution, Location:
,Talk,Kiel
Title:

A Large-Travel Hybrid Metrology Platform Integrating Laser Focus Sensor and Atomic Force Microscopy

Authors:

Davi Anders Brasil (1), Michael Katzschmann (1), Steffen Hesse (1), Ludwig Herzog (1), Thomas Fröhlich (2), and

Thomas Kissinger (2)

(1) IMMS; (2) Technische Universität Ilmenau

Event:
Symposium of the Association of University Professors of Measurement Technology

Abstract:

Modern micro- and nanoscale manufacturing requires traceable multi-scale metrology spanning macroscopic geometries and sub-micrometre features. Singlesensor systems are limited by trade-offs between resolution, speed, and measurement range. This work presents a hybrid platform integrating an optical microscope, laser focus sensor (LFS), and atomic force microscope (AFM) on a six-degrees-of-freedom (6-DOF) nanopositioning stage, enabling inspection within a ø 200 mm x 25 mm workspace. A multi-stage alignment protocol ensures lateral repeatability through optical-to-mechanical verification, coordinate transformation, and edge-feature cross-correlation. Experiments on a patterned ultra-low expansion (ULE) substrate demonstrate consistent centroid localisation between LFS and AFM, with standard deviations below 100 nm. Residual discrepancies, attributed to different sensing principles, remain stable over time. The system enables hierarchical inspection through optical guidance, large-area LFS scanning, and targeted AFM analysis, supporting future scalable in-line metrology for semiconductors, micro-optics, and microelectromechanical systems (MEMS) applications.

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[Translate to English:]

Service for R&D

Development of mechatronic systems

We develop actuator systems and open- and closed-loop controls as embedded solutions according to customer specifications with highest demands on precision, dynamics, available space, performance and efficiency.

Research field

Magnetic 6D direct drives with nm precision

To enable the manufacturing of macroscopic high-tech products with microscopic precision, we are researching scientific principles and technical solutions for nanopositioning systems for large motion ranges.

High-precision drive systems with spatial (6D) positioning accuracies in the single-digit nm range.

Lead application

nm measurement and structuring of objects

To be able to manufacture the ever-increasing complexity of integrated systems on ever-smaller semiconductor surfaces, for example, we are researching ever more precise drives for the nanometre measurement and structuring of objects.


Contact

Contact

Dipl.-Hdl. Dipl.-Des. Beate Hövelmans

Head of Corporate Communications

beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13

Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.

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