IMMS - Search

Event

891. euspen SIG: Micro/Nano Manufacturing 2023

Laser focus sensor for unconventional, lateral measurements of nanopositioning stages. Photograph: IMMS.

euspen Special Interest Group Meeting: Micro/Nano Manufacturing 2023

Reference

892. Evaluation and testing of GNSS receivers with real and synthetic satellite signals

Björn Bieske, Uwe Stehr, Matthias A. Hein, Syed N. Hasnain, Darmstadt, Germany 2024 36. ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2024)

Reference

893. Evaluation of 2D-/3D-Feet-Detection Methods for Semi-Autonomous Powered Wheelchair Navigation

Cristian Vilar Giménez, Silvia Krug, Faisal Z. Qureshi, Mattias O’Nils, 2021 Journal of Imaging

Reference

894. Evaluation of FinFET RF Building Blocks

Reference

895. Evaluation of Interoperability Between Various Implementations of the Thread Protocol Stack

Sebastian Miethe, Silvia Krug, Karlsruhe, Germany 2020 Workshop on Tools and Concepts for Communication and Networked Systems (TCoNS)

Reference

896. Evaluation of Low Leakage Currents using a Floating Gate Transistor

Reference

897. Evaluation of Low Leakage Currents using a Floating-Gate Transistor

Reference

898. Evaluation of triboelectric nanogenerators for low-frequency vibrations and their potential in wireless sensor networks

Marios Kaminiotis, Silvia Krug, Hannes Toepfer, Romain Noël, Julien Le Scornec, Vincent Le Cam, Bastien Chapuis, 2026 Smart Mater. Struct.

Reference

899. Evaluierung und Test der Empfangsleistung von Funksystemen

Björn Bieske, Michael Schenk, Potsdam, Germany 2026 38. ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2026)

Reference

900. Evaluierung und Test von HF-CMOS-Modulen, Einsatz von flexibel konfigurierbaren Testsystemen (PXI)

Björn Bieske, Klaus Heinrich, Bad Urach 2015 Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ 2015)