IMMS - Search

Reference

881. Identification of Critical Scenarios in AMS Verification: Methodology for Finding the Safe Operating Area of AMS Systems

Georg Gläser, Hyun-Sek Lukas Lee Markus Olbrich Erich Barke Eckhard Hennig 2016 Design, Automation & Test in Europe (DATE), 14 – 18 March 2016, University Booth, Embedded Tutorial: Analog-/Mixed-Signal Verification Methods for AMS Coverage Analysis, Dresden, Germany

Reference

882. IC-Entwicklung: Effizientere Simulation mit KI-basierter Modellfehlerschätzung

Henning Siemen, Martin Grabmann Eric Schäfer Georg Gläser Elektronik, 17-18/2023, 23. August 2023, Seite 66 - 69, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2317D

Service for R&D

883. IC design methods

Use our methods, tools and advice for your complex circuits and systems to achieve your goal efficiently. Photograph: IMMS.

Service for R&D: IC design methods. We develop new AI-based methods and tools for your system-on-chip and FPGA designs to master the increasing complexity of integrated systems and thus further increase performance.

Reference

884. Hybrid scheme to enable DTN routing protocols to efficiently exploit stable MANET contacts

Silvia Krug, Matthias Aumüller Jochen Seitz EURASIP Journal on Wireless Communications and Networking, Volume 2018, Article number: 237 (2018), https://doi.org/10.1186/s13638-018-1248-5

Reference

885. HW/SW-Co-Entwurf einer intelligenten Sensor-Schnittstelle mit Hilfe eines schnellen, Zyklenzahl-genauen, RTL-nahen Befehlssatz-Simulators

Gregor Nitsche, Eckhard Hennig Georg Gläser 15. Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), 2012, Kaiserslautern, 05.03.2012-07.03.2012

Reference

886. HTS SFQ circuit design

H.Töpfer, Hitachi Central Research Laboratory, 14.11.2002, Tokyo, Japan

Reference

887. HTS Multilayer Technology for Optimal Bit-Error Rate RSFQ Cells

D. Cassel, Th.Ortlepp K.S.Ilin G.Pickartz B.Kuhlmann R.Dittmann H. Töpfer IEEE Trans. Appl. Supercond., 13(2003) 2, S. 409-412

Reference

888. HoTSens

Tests for an ASIC developed by IMMS for extremely precise measurements in very hot environments. Photograph: IMMS.

Integrated sensors and microelectronics operate at 300°C, enabling more efficient processes

Reference

889. Hot Fuzz: Assisting verification by fuzz testing microelectronic hardware

Henning Siemen, Jonas Lienke Georg Gläser 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Funchal, Portugal, July 03-05, 2023, pp. 1-4, DOI: https://doi.org/10.1109/SMACD58065.2023.10192176

Reference

890. Hörbarmachung von Ultraschallsignalen

Peter Holstein, Nicki Bader A. Tharandt R. John S. Uziel D. Januszko T. Hutschenreuther Fortschritte der Akustik - DAGA 2016, 42. Jahrestagung für Akustik, 14.-17. März 2016