Ingo Ortlepp, Michael Kühnel, Martin Hofmann, Laura Weidenfeller, Johannes Kirchner, Shraddha Supreeti, Rostyslav Mastylo, Thomas Michels, Thomas Fröhlich, Denis Dontsov, Christoph Schäffel, Eberhard Manske,
2020
Proc. SPIE 11324, Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS
Björn Bieske, Tom Reinhold, Jun Tan,
Ludwigsburg, Germany
2020
32. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2020)
Jun Tan, Muralikrishna Sathyamurthy, Alexander Rolapp, Jonathan Gamez, Moataz Elkharashi, Benjamin Saft, Sylvo Jäger, Ralf Sommer,
2020
IEEE Journal of Radio Frequency Identification
“In this partnership, not only are we able to rely on consistently high quality, dependability on delivery dates and flexible responses when customised changes are needed, but we benefit all round because IMMS proactively contributes ideas and suggestions for improvement. We can thus recommend the Institute unreservedly as a provider of testing services to industry.”
“From our point of view, the design IMMS came up with for the architecture was in itself convincing. Further, we were impressed by its support in integrating our application with the MQTT standard. Both during the ongoing joint field test in Jena and during the entire project period, IMMS staff were always readily available with prompt support if questions or problems arose.”
“From my point of view, the numerous outcomes, many of them already validated by demonstrators, speak for themselves. These wireless solutions with their energy self-sufficiency are blazing the trail for quick, cheap and easy retrofitting. I envisage their use not only in manufacturing processes but in other areas such as transport and logistics.”
