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  204. Thermal Channel Noise of quarter and sub-quarter micron NMOS FET's   G. Knoblinger, P. Klein U. Baumann ICMTS 2000, USA, CA, Monterey, März 2000  

  205. Thermal Analysis of a Coil Assembly in a Nanopositioning Drive System via Reduced-Complexity CFD Modeling   Ina Naujokat, Ludwig Herzog Steffen Hesse Parastoo Salimitari Applied Sciences 2026, 16, 2748. DOI: https://doi.org/10.3390/app16062748  

  206. There is a limit to everything: Automated AMS Operating condition check Generation on System Level   Georg Gläser, Martin Grabmann Gerrit Kropp Andreas Fürtig Integration, Volume 63, 2018, Pages 383-391, ISSN 0167-9260, DOI: https://doi.org/10.1016/j.vlsi.2018.02.016  

  207. Themenkreis Virtual Test und automatische Testplangenerierung aus ATML   D. Glaser, P. Lu K. Helmreich I. Gryl M. Meister A. Lechner M. Jegler Z. Kiss Virtuelle Instrumente in der Praxis VIP 2010, 27.10.-28.10.2010, München, Proceedings  

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  209. The Rapid Single-Flux Quantum Technology - a Promising Alternative for the Development of High-Performance Digital Electronics   B. Dimov, T. Ortlepp H. F. Uhlmann Kleinheubacher Tagung 2007, 24.-27. September 2007, Miltenberg