IMMS - Search

Reference

1861. A single-switch AC-DC converter with power factor correction

H. Wei, P. Kornetzky I. Bartaseh IEEE Transactions on Power Electronics, No. 5/2000

Reference

1862. A Simulation Study on SpaceTime Equalization for Mobile Broadband Communication in an Industrial Indoor Environment

U. Trautwein, G. Sommerkorn R.S. Thomä IEEE Vehicular Technology Conference, 16.-20. May 1999, Houston

Reference

1863. A Simulation Study on SpaceTime Equalization for Mobile Broadband Communication in an Industrial Indoor Environment

U. Trautwein, G. Sommerkorn R.S. Thomä In: Proc.49th IEEE Vehicular Technology Conference, Band 1, S. 511- 515, 16.- 20.5. 1999

Reference

1864. A Retrofit Streetlamp Monitoring Solution Using LoRaWAN Communications

Sören Schneider, Marco Götze Silvia Krug Tino Hutschenreuther Eng 2024, 5, 513-531, DOI: https://doi.org/10.3390/eng5010028

Reference

1865. A Project Environment for ASIC Design Teams

V. Nakov, E. Hennig München: EMEA 2011 CDN Live!. 03.05. - 05.05.2011

Reference

1866. A Post-Layout Optimization Method With Automatic Device Type Selection for BiCMOS Analog Circuits

T. Reich, B. Dimov Ch. Lang V. Boos E. Hennig International Conference on Electronics Circuits and Systems, 13.-16. Dezember, 2009, Hammamet, Tunesien

Reference

1867. A novel technique for CAD-optimization of analog circuits with bipolar transistors

B. Dimov, V. Boos T. Reich Ch. Lang E. Hennig R. Sommer Advances in Radio Science, 7, 219-223, 2009

Reference

1868. A Novel Technique for CAD-Optimization of Analog Circuits with Bipolar Transistors

B. Dimov, V. Boos T. Reich Ch. Lang E. Hennig R. Sommer Kleinheubacher Tagung, 22.-25. September 2008, Miltenberg, Germany

Reference

1869. A Novel Low-Voltage Bandgap Reference Topology

M. Isikhan, 21. Mikroelektronik-Seminar, 16.04.2009, Erfurt

Reference

1870. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)

S. Richter, D. Kirsten D. Nuernbergk S. Richter A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C), D. Flandre et al. (eds.), Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Enviroment, pa: 285-290, Kluwer Academic Publishers, Januar 2005