1778 results
Reference
  1561. Verfahren zum Erweitern und Verwenden eines Modells zum Simulieren einer elektronischen Schaltung  
Georg Gläser, Martin Grabmann DE 10 2021 126 108 A1  
Reference
  1562. Frostrisikoerkennung mittels Knospenüberwachung im Obstbau  
Silvia Krug, Experimentierfelder-Konferenz 2023, 27. - 28. April 2023, Berlin  
Reference
  1563. Intelligentes Design: KI für EDA?  
Georg Gläser, edaWorkshop23, 8. - 9. Mai 2023, Hannover, Germany  
Reference
  1564. Waist Tightening of CNNs: A Case study on Tiny YOLOv3 for Distributed IoT Implementations  
Isaac Sánchez Leal, Eiraj Saqib Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils In Proceedings of Cyber-Physical Systems and Internet of Things Week 2023 (CPS-IoT Week '23), Association for Computing Machinery, San Antonio, TX, USA, May 9-12, 2023, pp. 241–246, DOI: https://doi.org/10.1145/3576914.3587518  
Reference
  1565. Tip-based nanofabrication below 40 nm combined with a nanopositioning machine with a movement range of Ø100 mm  
Jaqueline Stauffenberg, Michael Reibe Anja Krötschl Christoph Reuter Ingo Ortlepp Denis Dontsov Steffen Hesse Ivo W. Rangelow Steffen Strehle Eberhard Manske Micro and Nano Engineering, Volume 19, 2023, 100201, ISSN 2590-0072, DOI: https://doi.org/10.1016/j.mne.2023.100201  
Reference
  1566. LO and Calibration Signal Distribution in a Multi-Antenna Satellite Navigation Receiver  
Uwe Stehr, Syed N. Hasnain Björn Bieske Marius Brachvogel Michael Meurer Matthias A. Hein in Proceedings of the European Navigation Conference 2023, Noordwijk, Zuid-Holland, May 31 - June 2, 2023, Eng. Proc. 2023, 54, 23. DOI: https://doi.org/10.3390/ENC2023-15447  
Career
  1567. Vocational Training  
[Translate to English:] Vocational Training: Sophisticated education in scientific environment. Since 1997 we have taken on trainees.  
Press release
  1568. Reliable and faster chip designs through invasive and parametric simulation methods  
Dissertation on new methods for automation in integrated circuit design  
Reference
  1569. Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques  
Sebastian Giessmann, Steffen Michael Eric Lawrence Dr. Heinrich Steger Commercial Micro Manufacturing International Magazine (CMM Magazine), 08-2023, VOL 16 NO. 3, pp. 30-39  
Reference
  1570. Under Cover: On-FPGA Coverage Monitoring by Netlist Instrumentation  
Manuel Jirsak, Henning Siemen Jonas Lienke Martin Grabmann Eric Schäfer Georg Gläser 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Funchal, Portugal, July 03-05, 2023, pp. 1-4, DOI: https://doi.org/10.1109/SMACD58065.2023.10192205  
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