1551. Design of Rapid Single Flux Quantum Circuits   H. Töpfer, Proceedings of the 8th International Workshop on Low Temperature Electronics, S. 97-98, 22.-25. Juni 2008, Jena/Gabelbach, Germany  

  1552. Design of Rapid Single Flux Quantum Circuits   H. Töpfer, 8th International Workshop on Low Temperature Electronics-Wolte, 22.-25. Juni 2008, Jena/Gabelbach, Germany  

  1553. Design of Quasi-synchronous Finite State Machines Using a Local On-demand Clocking Approach   Athanasios Gatzastras, Dominik Wrana Tobias Wolfer Georg Gläser Benjamin Saft Eric Schäfer Eckhard Hennig Analog 2018, 16. GMM/ITG-Fachtagung, München-Neubiberg, 12-14 September 2018, Proceedings: https://www.vde-verlag.de/proceedings-en/454754003.html  

  1554. Design of optical receivers (System and circuit level approaches).   A. Amar, 50. Mikroelektronik-Seminar, 11.08.2010, Erfurt  

  1555. Design of HTS RSFQ circuits   H. Töpfer, Th. Ortlepp F.H. Uhlmann D. Cassel M. Siegel Physica C, 392-396(2003), S. 1420-1425  

  1556. Design of HTS RSFQ circuits   H.Töpfer, 15 th International Symposium on Superconductivity ISS 2002, 12.11.2002, Yokohama, Japan  

  1557. Design of High Temperature Circuits in a 1µm SOI-Technology   D. Nuernbergk, GMM-Workshop, Mai 2001  

  1558. Design of an interferometric test station for parallel inspection of MEMS   C. Schäffel, S. Michael R. Paris A. Frank N. Zeike K. Gastinger M. Kujawinska U. Zeitner S. Beer Ilmenau. In Proceedings. 56. Int. wissenschaftliches Kolloquium der TU Ilmenau. URN: urn:nbn:de:gbv:ilm1-2011iwk-098:5  

  1559. Design of an interferometric test station for parallel inspection of MEMS   C. Schäffel, S. Michael R. Paris A. Frank N. Zeike K. Gastinger M. Kujawinska U. Zeitner S. Beer Ilmenau: 56. IWK der TU Ilmenau. 12.09. - 16.09.2011  

  1560. Design of a Test Station for Magnetoelectric Sensor Development   Maximilian Krey, Hannes Toepfer Roman Paris Thomas Froehlich 2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF), 29 - 31 August 2019, Nancy, France, 2019, pp. 1-2, DOI: https://doi.org/10.1109/ISEF45929.2019.9097048