IMMS - Search

Reference

1281. OPTOELECTRONICS BiCMOS OEIC for optical storage systems

M. Heise, K. Kieschnick H. Pleß H. Zimmermann Electronics Letters, September 1998

Reference

1282. OptoMed vacuum air bearings

Set-up consisting of metal pipes, cables and measuring devices on a laboratory bench.

Air bearings in high-precision vacuum applications? Together with our partners, we are exploring the technical feasibility of this (apparent) contradiction.

Reference

1283. OPV und TIA-Optimierung mit WiCkeD

V. Boos, St. Lange Workshop: 'Effizienzsteigerung und Ausbeuteverbesserung im analogen Schaltungsentwurf mit WiCkeD, 20.01.2004, Erfurt

About us

1284. Organisation

Organigram of IMMS. Photograph: Kvalifik, Unsplash.

Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.

Reference

1285. Ovutinin

Mit einem neuen Ovulationsschnelltest soll die fruchtbare Phase bis zu 6 Tage vor dem Eisprung bestimmt werden. Image by Serhii Kuch from Pixabay.

For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.

Reference

1286. PANDIA

Latest generation spectroradiometer: JETI specbos 2501. In the PANDIA project, integrated sensors will be developed for such devices to analyse light significantly better and more efficiently for many applications. Photograph: JETI GmbH.

IMMS develops novel CMOS and SPAD sensor ICs for spectroradiometers for faster and more sensitive analysis of light

Reference

1287. Parameter Identification of Membrane Structures - Chances and Limitations

S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France

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1288. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements

St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig

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1289. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements

St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands

Reference

1290. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen

S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt