Encouragement of young academics: It is one of our highest priorities to bring on the new blood in science. The fact that we network so closely with industry provides young scientists with the opportunity to work on subjects of practical relevance where the results really matter.
Erich Barke,
Georg Gläser
Hyun-Sek Lukas Lee, Markus Olbrich
Andreas Fürtig, Lars Hedrich
Carna Radojicic, Christoph Grimm
Fabian Speicher, Stefan Heinen
Gregor Nitsche
Eckhard Hennig
Wolfgang Nebel
2016 Design, Automation & Test in Europe (DATE), 14-18 March 2016, pp. 1102 - 1111, http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7459473&isnumber=7459269
D. Kirsten,
D. Nuernbergk
S. Richter
St. Richter
Fachzeitschrift 'Solid-State Electronics' Nr. 49 (2005) page 1484-1487, Veröffentlichung, November 2005
Core topic Embedded AI in our Smart distributed measurement and test systems research field: The numerous existing AI algorithms and methods for high-performance computing are unsuitable for embedded systems. We are researching to optimise AI algorithms and methods so that they can be used on embedded systems.
Björn Bieske,
Gerrit Kropp
Analog Workshop Berlin 2017, Technische Universität Berlin, Institut für Technische Informatik und Mikroelektronik, 2.-3. März 2017, Berlin